AD1876JN Analog Devices, AD1876JN Datasheet - Page 3

• Manufacturer Part Number: AD1876JN
• Description: 16-Bit 100 kSPS Sampling ADC
• Manufacturer: Analog Devices

DIGITAL SPECIFICATIONS
Parameter
LOGIC INPUTS
LOGIC OUTPUTS
Specifications subject to change without notice.
Specifications shown in boldface are tested on all devices at final electrical test at worst case temperature. Results from those tests are used to calculate outgoing qual-
ity levels. All min and max specifications are guaranteed, although only those shown in boldface are tested.
ABSOLUTE MAXIMUM RATINGS*
V
V
V
V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital Inputs to DGND . . . . . . . . . . . . . . . . . . . 0 V to 5.5 V
Analog Inputs, V
TIMING SPECIFICATIONS
Parameter
Sampling Rate
Sampling Period
Acquisition Time (Included in t
Calibration Time
CLK Period
CAL to BUSY Delay
CLK to BUSY Delay
CLK to D
CLK HIGH
CLK LOW
D
SAMPLE LOW to 1st CLK Delay
CAL HIGH Time
CLK to D
SAMPLE LOW
NOTES
1
2
REV. A
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD1876 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
See Figure 1 and Figure 2 and the Conversion Control and Autocalibration sections for detailed explanations of the above timing.
Depends upon external clock frequency; includes acquisition time and conversion time. The minimum sampling rate/maximum sampling period is specified to
account for droop of the internal sample/hold. Operation at slower rates than specified may degrade performance.
CC
DD
CC
EE
OUT
V
V
I
I
C
V
V
IH
IL
IH
IL
OH
OL
IN
to AGND . . . . . . . . . . . . . . . . . . . . . . . . –18 V to +0.3 V
to V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +18 V
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
CLK LOW
EE
OUT
OUT
. . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +26.4 V
2
Hold Time
CLK
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
Input Capacitance
High Level Output Voltage
Low Level Output Voltage
2
REF
to AGND . . . . . . . . . . . (V
S
)
1
(T
(T
MIN
MIN
to T
to T
MAX
MAX
Symbol
f
t
t
t
t
t
t
t
t
t
t
t
t
t
t
, V
S
S
A
CT
C
CALB
CB
CD
CH
CL
DCL
SC
CALH
CDH
SL
, V
CC
(V
= 1/t
= l/f
Test Conditions
V
V
I
I
I
CC
CC
OH
OH
OL
+ 0.3 V) to
EE
IH
IL
= +12 V
= +12 V
S
= 0 V
= 1.6 mA
= 0.1 mA
= 0.5 mA
S
= V
– 0.3 V)
0.3 V
DD
–3–
5%, V
5%, V
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300 C, 10 sec
Storage Temperature . . . . . . . . . . . . . . . . . . –60 C to +100 C
*Stresses greater than those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those
indicated in the operational section of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect device
reliability.
EE
EE
Min
1
10
2
480
0
50
10
160
50
30
50
4
150
50
= –12 V
= –12 V
Min
2.4
–0.3
–10
–10
V
2.4
DD
– 1 V
5%, V
5%, V
DD
DD
Typ
120
80
200
= +5 V
= +5 V
Typ
10%, V
10%)
WARNING!
REF
Max
100
1000
5000
175
200
275
= 5.00 V)
Max
0.8
+10
+10
10
0.4
ESD SENSITIVE DEVICE
AD1876
Units
V
V
pF
V
V
V
Units
kSPS
t
ns
ns
ns
ns
ns
ns
ns
ns
t
ns
ns
C
C
A
A
s
s