IXS839S1T-R Clare, Inc., IXS839S1T-R Datasheet - Page 2

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IXS839S1T-R

Manufacturer Part Number
IXS839S1T-R
Description
Synchronous Buck Mosfet Driver
Manufacturer
Clare, Inc.
Datasheet
Figure 3. IXS839B Functional Block Diagram and General Application Circuit
Ordering Information
Absolute Maximum Ratings
ESD Warning
ESD (electrostatic discharge) sensitive device. Electrostatic charges can readily accumulate on test equipment and the human body
in excess of 4000 Volts. This energy can discharge without detection. Although the IXS839/839A/839B feature proprietary ESD
protection circuitry, permanent damage may be sustained if subjected to high energy electrostatic discharges. Proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
Part No.
IXS839S1
IXS839S1T/R
IXS839D1
IXS839AQ2
IXS839AQ2T/R
IXS839AD2
IXS839BQ2
IXS839BQ2T/R
IXS839BD2
Parameter
V
BST
BST to SW
SW
PWM
Operating Ambient Temp Range
Operating Junction Temp Range
θJA
θJC
Storage Temp Range
Lead Temperature (Soldering, 10 sec)
DD
PWM
DLY
LSD
SD
CDLY
IXYS
1
2
4
3
PROTECTION
OVERLAP
CIRCUIT
Description
Under Voltage Lockout
Under Voltage Lockout
Under Voltage Lockout
Driver Shutdown, Low Side Shutdown
Driver Shutdown, Low Side Shutdown
Driver Shutdown, Low Side Shutdown
Under Voltage Lockout , Driver Shutdown, Low Side Shutdown
Under Voltage Lockout , Driver Shutdown, Low Side Shutdown
Under Voltage Lockout , Driver Shutdown, Low Side Shutdown
UVLO
10
5
9
8
6
7
+300°C
Rating
-0.3V to +7V
-0.3V to +30V
-0.3V to +7V
-0.2V to +24V
-0.3V to +7V
-40°C to +85°C
-40°C to +125°C
150°C/W
40°C/W
-65°C to +150°C
VDD
HGD
PGND
BST
LGD
SW
5V
CBST
DBST
Q1
Q2
VIN
2
VOUT
Absolute Maximum Ratings are stress ratings.
Stresses in excess of these ratings can cause
permanent damage to the device. Functional
operation of the device at these or any other
conditions beyond those indicated in the operational
sections of this data sheet is not implied. Exposure
of the device to the absolute maximum ratings for
an extended period may degrade the device and
affect its reliability.
IXS839 / IXS839A / IXS839B
Package
8-Pin SOIC
8-Pin SOIC
Tested Die
10-Pin QFN
10-Pin QFN
Tested Die
10-Pin QFN
10-Pin QFN
Tested Die
Pack Quantity
98
2500 (Tape & Reel)
121 (Tube)
2000 (Tape & Reel)
121 (Tube)
2000 (Tape & Reel)
(Tube)

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