SD834-03-TE12R Fuji Electric holdings CO.,Ltd, SD834-03-TE12R Datasheet - Page 5

• Manufacturer Part Number: SD834-03-TE12R
• Description: Silicon Diode
• Manufacturer: Fuji Electric holdings CO.,Ltd

Fuji Electric Device Technology Co.,Ltd.
Preparation : Test items required without fail : Test Method B-121,B-122,B-123,B-131,B-141
Baking treatment : 125±5°C, 24hr
Humidification treatment : 85±2°C,85±5%RH,72±2hr
Soldering heat for surface mounting : Reflow soldering 255℃max.(230℃ or more are processed within in 30
Failure Criteria
Test
sec.), 2times.
No.
10
1
2
3
4
5
6
7
8
9
High Temp.
Storage
Low Temp.
Storage
Temperature
Humidity
Storage
Temperature
Humidity
Bias
Unsaturated
Pressurized
Vapor
Temperature
Cycle
Thermal
Shock
Steady state
Operating
life
Intermittent
Operating
life
High Temp.
Reverse
Bias
Items
Test
Temperature :Ｔstg max
Test duration : 1000h
Temperature :Ｔstg min
Test duration : 1000h
Temperature : 85±2°C
Relative humidity : 85±5%
Test duration : 1000h
Temperature : 85±2°C
Relative humidity : 85±5%
Bias Voltage : V
Test duration : 1000h
Temperature : 130±2°C
Relative humidity : 85±5%
Vapor pressure : 2.3×10
Test duration : 48h
High temp. side : Tstg max
Room temp. : 5～35℃
Low temp. side : Tstg min
Duration time : HT 30min,
RT 5min LT 30min
Number of cycles : 100 cycles
Fluid :pure water(running water)
High temp. side : 100+0/-5℃
Low temp. side : 0+5/-0℃
Duration time : HT 5min,LT 5min
Number of cycles : 100 cycles
Ta=25±5°C
Rated load
Test duration : 1000h
Tj≦Tjmax
ON:1min,OFF:2min
Test duration 1000cycles
Temperature : Ta=80 °C
Bias Voltage : V
Test duration : 1000h
I
V
R
Testing methods and Conditions
F
≦USL x 1.1
≦USL x 2
RRM
R
=V
× 0.8
RRM
(DC)
5
Pa
USL : Upper specification Limit
(test code A)
EIAJ ED4701
test code C
test code C
test code C
Reference
Standard
(B-131)
(B-141)
(D-403)
D-402
D-404
B-112
B-121
B-122
B-123
B-111
MS5D2341
Sampling
number
22
22
22
22
22
22
22
22
22
22
5/12
Acceptance
number
(0 : 1)
H04-004-03a