ACS373D Intersil Corporation, ACS373D Datasheet - Page 6

• Manufacturer Part Number: ACS373D
• Description: Radiation Hardened Octal Transparent Latch, Three-state
• Manufacturer: Intersil Corporation

Intersil - Space Products MS Screening
Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM)
Radiation Verification (Each Wafer) Method 1019,
100% Nondestructive Bond Pull Method 2023
100% Internal Visual Inspection Method 2010
100% Temperature Cycling Method 1010 Condition C
100% Constant Acceleration
100% PIND Testing
100% External Visual Inspection
100% Serialization
100% Initial Electrical Test
100% Static Burn-In 1 Method 1015, 24 Hours at +125
100% Interim Electrical Test 1 (Note 1)
NOTES:
Propagation Delay Timing Diagram and Load Circuit
VOH
VOL
VSS
1. Failures from interim electrical tests 1 and 2 are combined for determining PDA (PDA = 5% for subgroups 1, 7, 9 and delta failures com-
2. These steps are optional, and should be listed on the purchase order if required.
3. Data Package Contents:
VIH
bined, PDA = 3% for subgroup 7 failures). Interim electrical tests 3 PDA (PDA = 5% for subgroups 1, 7, 9 and delta failures combined,
PDA = 3% for subgroup 7 failures).
Cover Sheet (P.O. Number, Customer Number, Lot Date Code, Intersil Number, Lot Number, Quantity).
Certificate of Conformance (as found on shipper).
Lot Serial Number Sheet (Good Unit(s) Serial Number and Lot Number).
Variables Data (All Read, Record, and delta operations).
Group A Attributes Data Summary.
Wafer Lot Acceptance Report (Method 5007) to include reproductions of SEM photos. NOTE: SEM photos to include percent of step coverage.
X-Ray Report and Film, including penetrometer measurements.
GAMMA Radiation Report with initial shipment of devices from the same wafer lot; containing a Cover Page, Disposition, RAD Dose,
Lot Number, Test Package, Spec Number(s), Test Equipment, etc. Irradiation Read and Record data will be on file at Intersil.
4 Samples/Wafer, 0 Rejects
(-65
o
to +150
VS
o
C)
TPLH
VS
INPUT
OUTPUT
TPHL
Specifications ACS373MS
o
C Min
6
100% Static Burn-In 2 Method 1015, 24 Hours at +125
100% Interim Electrical Test 2 (Note 1)
100% Dynamic Burn-In Method 1015, 240 Hours at +125
100% Interim Electrical Test 3 (Note 1)
100% Final Electrical Test
100% Fine and Gross Seal Method 1014
100% Radiographics Method 2012 (2 Views)
100% External Visual Method 2009
Group A (All Tests) Method 5005 (Class S)
Group B (Optional) Method 5005 (Class S) (Note 2)
Group D (Optional) Method 5005 (Class S) (Note 2)
CSI and/or GSI (Optional) (Note 2)
Data Package Generation (Note 3)
VCC
VIH
VS
VIL
GND
PARAMETER
or 180 Hours at +135
DUT
50pF
CL
AC VOLTAGE LEVELS
ACS
o
4.50
4.50
2.25
C
0
0
RL
500
Spec Number
TEST
POINT
UNITS
V
V
V
V
V
518799
o
C Min
o
C