NL17SZ00 ON Semiconductor, NL17SZ00 Datasheet - Page 2
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NL17SZ00
Manufacturer Part Number
NL17SZ00
Description
Single 2-input Nand Gate
Manufacturer
ON Semiconductor
Datasheet
1.NL17SZ00.pdf
(6 pages)
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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B.
3. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
RECOMMENDED OPERATING CONDITIONS
MAXIMUM RATINGS
Symbol
Symbol
V
V
T
I
MSL
ESD
V
V
t
V
I
OUT
I
q
V
P
OUT
I
STG
T
F
OUT
T
T
r
OK
CC
CC
IK
CC
, t
JA
IN
IN
D
R
A
L
J
f
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
Flammability Rating
ESD Classification
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Operating Temperature Range
Input Rise and Fall Time
Parameter
Parameter
Charged Device Model (Note 4)
Human Body Model (Note 2)
http://onsemi.com
NL17SZ00
Machine Model (Note 3)
Oxygen Index: 28 to 34
V
V
CC
CC
2
SOT−353 (Note 1)
= 3.0 V $0.3 V
= 5.0 V $0.5 V
SOT−553
SOT−353
SOT−553
UL 94 V−0 @ 0.125 in
*40
1.65
*0.5 to to V
Min
0
0
0
0
*0.5 to )7.0
*0.5 to )7.0
*65 to )150
Class Z
Class A
Level 1
$100
)150
Value
*50
*50
$50
260
350
496
186
135
N/A
CC
V
CC
+ 0.5
)85
Max
100
5.5
5.5
20
+ 0.5
°C/W
Unit
Unit
ns/V
mW
mA
mA
mA
mA
°C
°C
°C
°C
V
V
V
V
V
V