HS-0547RH Intersil Corporation, HS-0547RH Datasheet - Page 5

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HS-0547RH

Manufacturer Part Number
HS-0547RH
Description
Rad-hard Single 16/differential 8 Channel Cmos Analog Multiplexers With Active Overvoltage Protection
Manufacturer
Intersil Corporation
Datasheet
Burn-In/Life Test Circuits
NOTES:
Irradiation Circuit
V1
F3
1. The Dynamic Test Circuit is utilized for all life testing.
2. V1 = +15V minimum, +16V maximum.
3. V2 = -15V maximum, -16V minimum.
4. R1, R2 = 10kΩ, ±5%, 1/4 or 1/2W (per socket).
5. C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum
6. D1, D2 = 1N4002 or equivalent (per board).
7. F0 = 100kHz, 10%; F1 = F0/2; F2 = F1/2; F3 = F2/2; F4 = F3/2
(per row).
40% - 60% duty cycle; VIL = 0.8V maximum;
VIH = 4.0V minimum.
C1
D1
R1
DYNAMIC AND LIFE TEST
10
11
12
13
14
1
2
3
4
5
6
7
8
9
5
10kΩ
28
27
26
25
24
23
22
21
20
19
18
17
16
15
+15V
+1V
+5V
NC
R2
HS-0546RH, HS-0547RH
D2 C2
10
12
13
14
11
V2
1
2
3
4
5
6
7
8
9
F4
F0
F1
F2
NOTES:
10. V3 = -15V maximum, -16V minimum.
12. C1, C2 = 0.01µF minimum (per socket) or 0.1µF minimum
13. D1, D2 = 1N4002 or equivalent (per board).
11. R1, R2 = 10kΩ, ±5%, 1/4 or 1/2W (per socket).
V2
8. V1 = +5V minimum, +6V maximum.
9. V2 = +15V minimum, +16V maximum.
V1
(per row).
C1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
D1
-15V
R1
10
11
12
13
14
1
2
3
4
5
6
7
8
9
10kΩ
STATIC
28
27
26
25
24
23
22
21
20
19
18
17
16
15
R2
March 13, 2006
D2 C2
FN3544.4
V3

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