CORE-2.5V Integrated Device Technology, CORE-2.5V Datasheet - Page 7

• Manufacturer Part Number: CORE-2.5V
• Description: 350mhz, Crystal-to-lvcmos / Lvttl Frequency Synthesizer
• Manufacturer: Integrated Device Technology

Table 4B. LVCMOS/LVTTL DC Characteristics, T
NOTE 1: Outputs terminated with 50
Table 5. Input Frequency Characteristics, T
NOTE 1: For the input crystal and TEST_CLK frequency range, the M value must be set for the VCO to operate within the 250MHz to
700MHz range. Using the minimum input frequency of 12MHz, valid values of M are 21 d M d 58. Using the maximum input frequency of
40MHz, valid values of M are 7 d M d 17.
IDT™ / ICS™ LVCMOS/LVTTL FREQUENCY SYNTHESIZER
Symbol
V
V
I
I
V
V
Symbol Parameter
f
IH
IL
IN
ICS8402I
350MHZ, CRYSTAL-TO-LVCMOS/LVTTL FREQUENCY SYNTHESIZER
IH
IL
OH
OL
Input
Frequency
Parameter
Input High Voltage
Input
Low Voltage
Input
High Current
Input
Low Current
Output
High Voltage
Output
Low Voltage
TEST_CLK; NOTE 1
XTAL_IN, XTAL_OUT; NOTE 1
S_CLOCK
OE0, OE1, MR,
M0:M8, N0, N1,
S_CLOCK, S_DATA,
S_LOAD, nP_LOAD,
VCO_SEL, XTAL_SEL
TEST_CLOCK
TEST_CLOCK, MR,
M0:M4, M6:M8, N0, N1,
S_CLOCK, S_DATA,
S_LOAD, nP_LOAD
M5, XTAL_SEL,
VCO_SEL, OE0, OE1
TEST_CLOCK, MR,
M0:M4, M6:M8, N0, N1,
S_CLOCK, S_DATA,
S_LOAD, nP_LOAD
M5, XTAL_SEL,
VCO_SEL, OE0, OE1
TEST; NOTE 1
TEST; NOTE 1
:
to V
DDO
/2. See Parameter Measurement Information section. Load Test Circuit diagrams.
A
= -40°C to 85°C
A
= -40°C to 85°C
V
V
V
DDO
DD
DD
V
V
Test Conditions
DD
DD
V
V
= 3.465V, V
= 3.465V, V
DDO
DDO
= 3.465 or 2.625V
Test Conditions
= V
= V
7
IN
IN
= 3.465V
= 2.625V
= 3.465V
= 3.465V
IN
IN
= 0V
= 0V
Minimum
-150
-0.3
-0.3
Minimum
2.6
1.8
-5
2
12
12
ICS8402AYI REV. A OCTOBER 16, 2007
Typical
Typical
Maximum
V
Maximum
DD
150
0.8
1.3
0.5
5
40
40
50
+ 0.3
Units
Units
MHz
MHz
MHz
µA
µA
µA
µA
V
V
V
V
V
V