CM28C010-120 Maxwell Technologies, Inc., CM28C010-120 Datasheet - Page 35

• Manufacturer Part Number: CM28C010-120
• Description: Microcircuit Memory Digital CMOS 128k x 8-Bit EEPROM Monolithic Silicon
• Manufacturer: Maxwell Technologies, Inc.

DSCC FORM 2234
(see 3.5 herein). RHA levels for device classes M, Q, and V shall be as specified in MIL-PRF-38535.
request.
available upon request.
and shall be made available upon request.
before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical parameters
to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option, either perform delta
measurements or within 24 hours after burn-in perform final electrical parameter tests, subgroups 1, 7, and 9.
Q and V or MIL-PRF-38535, appendix A for device class M.
equipment), design applications, and logistics purposes.
specification or drawing.
APR 97
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate figures and tables as follows.
4.5.1 Erasing procedures. The erasing procedures shall be as specified by the device manufacturer and shall be available upon
4.5.2 Programming procedure. The programming procedures shall be as specified by the device manufacturer and shall be made
4.5.3 Software data protect procedures. The software data protect procedures shall be as specified by the device manufacturer
4.6 Delta measurements for device classes Q and V. Delta measurements, as specified in table IIA, shall be made and recorded
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
a.
b.
c.
DEFENSE SUPPLY CENTER COLUMBUS
End-point electrical parameters shall be as specified in table IIA herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified
in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation
hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes
must meet the postirradiation end-point electrical parameter limits as defined in table IA at T = +25 ( C ±5 ( C, after
exposure, to the subgroups specified in table IIA herein.
When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
COLUMBUS, OHIO 43216-5000
MICROCIRCUIT DRAWING
STANDARD
SIZE
A
REVISION LEVEL
G
A
SHEET
5962-38267
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