GRM219R71E224KA01D Samsung, GRM219R71E224KA01D Datasheet

GRM219R71E224KA01D

Manufacturer Part Number

GRM219R71E224KA01D

Description

Manufacturer

Samsung

Series

GRMr

Datasheet

1.GRM219R71E224KA01D.pdf (4 pages)

Specifications of GRM219R71E224KA01D

Size

0805

Tolerance

+/- 10%

Available stocks

Company

Part Number

Manufacturer

Quantity

Price

Company:

Bonase Electronics (HK) Co., Limited

Part Number:

GRM219R71E224KA01D

Manufacturer:

MURATA

Quantity:

48 000

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!Note

No.

GRM Series Specifications and Test Methods (1)

Operating

Temperature

Range

Rated Voltage

Appearance

Dimensions

Dielectric Strength

Insulation

Resistance

Capacitance

Temperature

Characteristics

Adhesive Strength

of Termination

1. This Specifications and Test Methods is downloaded from the website of Murata Manufacturing co.,ltd. Therefore, it's specifications are subject to change or our products in it may be discontinued without advance notice.

2. This Specifications and Test Methods has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product

Please check with our sales representatives or product engineers before ordering.

specifications before ordering.

Item

No bias

Capacitance

Drift

–55 to +125 C

(2P/R/S/T, 3P/R/S/T/U, 4P/R/S/T/U: –25 to +85 C)

See the previous pages.

No defects or abnormalities

Within the specified dimensions

No defects or abnormalities

CV0.047 F: More than 10,000M

CG0.047 F: More than 500 · F

Within the specified tolerance

30pF and over: QU1000

30pF and below: QU400+20C

C: Nominal Capacitance (pF)

Within the specified tolerance (Table A-1)

Within 0.2% or 0.05pF

(Whichever is larger.)

*Do not apply to 1X/25V

No removal of the terminations or other defect should occur.

Temperature Compensating Type

Specifications

Fig. 1a

C: Nominal Capacitance

Solder resist

Baked electrode or

copper foil

Reference temperature: 25 C

(2 , 3 , 4 : 20 C)

The rated voltage is defined as the maximum voltage which

may be applied continuously to the capacitor.

When AC voltage is superimposed on DC voltage, V

whichever is larger, should be maintained within the rated

voltage range.

Visual inspection

Using calipers (GRM02 size is based on Microscope)

No failure should be observed when 300%* of the rated voltage

is applied between the terminations for 1 to 5 seconds,

provided the charge/discharge current is less than 50mA.

The insulation resistance should be measured with a DC

voltage not exceeding the rated voltage at Reference

Temperature and 75%RH max. and within 2 minutes of

charging, provided the charge/discharge current is less than

50mA.

The capacitance/Q/D.F. should be measured at Reference

Temperature at the frequency and voltage shown in the table.

The capacitance change should be measured after 5 min. at

each specified temp. stage.

The temperature coefficient is determined using the

capacitance measured in step 3 as a reference.

When cycling the temperature sequentially from step 1 through

5 (5C: +25 to +125 C/ C: +20 to +125 C: other temp. coeffs.:

+25 to +85 C/+20 to +85 C) the capacitance should be within

the specified tolerance for the temperature coefficient and

capacitance change as Table A-1.

The capacitance drift is calculated by dividing the differences

between the maximum and minimum measured values in the

step 1, 3 and 5 by the cap. value in step 3.

Solder the capacitor to the test jig (glass epoxy board) shown in

Fig. 1a using a eutectic solder. Then apply 10N* force in

parallel with the test jig for 10 1 sec.

The soldering should be done either with an iron or using the

reflow method and should be conducted with care so that the

soldering is uniform and free of defects such as heat shock.

*1N (GRM02), 2N (GRM03), 5N (GRM15, GRM18)

Item

GRM02

GRM03

GRM15

GRM18

GRM21

GRM31

GRM32

GRM43

GRM55

Frequency

Voltage

Type

Step

Capacitance

1000pF and below

0.5 to 5Vrms

0.2

0.3

0.4

1.0

1.2

2.2

3.5

4.5

Test Method

1 0.1MHz

Reference Temperature 2

–55 3 (for C to 7U)

–25 3 (for other TC)

85 3 (for other TC)

Continued on the following page.

Temperature ( C)

125 3 (for C)

0.56

0.9

1.5

3.0

4.0

5.0

7.0

8.0

more than 1000pF

1 0.2Vrms

1 0.1kHz

0.23

1.65

P-P

0.3

0.5

1.2

2.0

2.9

3.7

5.6

(in mm)

or V

O-P

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GRM219R71E224KA01D Summary of contents

Page 1

... This Specifications and Test Methods is downloaded from the website of Murata Manufacturing co.,ltd. Therefore, it's specifications are subject to change or our products in it may be discontinued without advance notice. !Note 0. Please check with our sales representatives or product engineers before ordering. 2. This Specifications and Test Methods has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product ...

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GRM219R71E224KA01D Samsung, GRM219R71E224KA01D Datasheet

GRM219R71E224KA01D

Specifications of GRM219R71E224KA01D

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