2-353082-2 TE Connectivity, 2-353082-2 Datasheet - Page 9

• Manufacturer Part Number: 2-353082-2
• Manufacturer: TE Connectivity

Specifications of 2-353082-2

• Product Type: Connector
• Connector Type: Header
• Mount: Board Mount
• Keyed: Yes
• Product Series: D-5200S
• Pcb Mounting Orientation: Vertical
• Pcb Mount Style: Through Hole
• Pcb Mount Retention: With
• Keying: Y
• Voltage Rating (vac): 630
• Termination End Plating: Gold over Nickel
• Number Of Positions: 3
• Number Of Rows: 1
• Centerline, Matrix (mm [in]): 10.16 [.400]
• Pcb Mount Retention Type: Boardlock(s)
• Contact Type: Pin
• Contact Plating, Mating Area, Material: Gold (15)
• Contact Base Material: Copper Alloy
• Connector Style: Plug
• Housing Material: Thermoplastic - GF
• Ul Flammability Rating: UL 94V-0
• Housing Color: Black
• Rohs/elv Compliance: RoHS compliant, ELV compliant
• Lead Free Solder Processes: Wave solder capable to 240°C, Wave solder capable to 260°C, Wave solder capable to 265°C
• Rohs/elv Compliance History: Converted to comply with RoHS directive
• Applies To: Printed Circuit Board
• Packaging Quantity: 12
• Packaging Method: Tube

4. 製品認定試験の試験順序
4. Product Qualification Test Sequence
製品の確認検査
総合抵抗
(ﾛｰﾚﾍﾞﾙ)
耐電圧
絶縁抵抗
温度上昇
振動
衝撃
コネクタ挿入力
コネクタ引抜力
ハウジングロック強度
コンタクト装着力
コンタクト保持力
圧着部引張強度
耐久性
(繰り返し挿抜)
はんだ付け性
はんだ耐熱性
熱衝撃
温湿度サイクリング
亜硫酸ガス
高温寿命
硫化水素
(a)欄内の数字は試験を実施する順序を示す。/Numbers indicate sequence in which tests are performed.
Rev. C
試験項目
Fig. 3 製品認定試験の試験順序 / Product Qualification Test Sequence Test
Examination of Product
Contact Resistance
(Low Level)
Dielectric withstanding
Voltage
Insulation Resistance
Temperature Rising
Vibration
Physical Shock
Conn. Mating Force
Conn. Unmating Force
Conn. Locking Strength
Cont. Insertion Force
Cont. Retention Force
Crimp Tensile Strength
Durability (Repeated
Mate/Unmating)
Solderability
Resistance to
Soldering heat
Thermal Shock
Humidity-Temperature
Cycling
Industrial SO
Temperature Life
Industrial H
Test Examination
Fig.4 総合抵抗測定 / Measurement of contact resistance
2
S gas
2
gas
Product Specification
2,5,
3,6
1
1
4
2,5
2
1
3
4
2,4,6
8,10
3
1
3
7
9
5
2,5
4
1
3
4
試験順序／Test Sequence(a)
mΩ=（V－Vw）/A
試験ｸﾞﾙｰﾌﾟ／Test Group
5
1
2
3,6
2,5
6
1
4
7
1
2
8
1
2
3
9
1
2
10
1
2
108-5453
11
1
2
9 of 11
2,5
12
1
3
4