OP285 Analog Devices, OP285 Datasheet
OP285
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OP285 Summary of contents
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... Bias currents are also low compared to bipolar designs. The OP285 offers the slew rate and low power of a JFET amplifier combined with the precision, low noise and low drift of a bipolar amplifier. Input offset voltage is laser-trimmed and guaranteed less than 250 µ ...
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... OP285–SPECIFICATIONS Parameter INPUT CHARACTERISTICS Offset Voltage Input Bias Current Input Offset Current Input Voltage Range Common-Mode Rejection Large-Signal Voltage Gain Common-Mode Input Capacitance Differential Input Capacitance Long-Term Offset Voltage Offset Voltage Drift OUTPUT CHARACTERISTICS Output Voltage Swing POWER SUPPLY Power Supply Rejection Ratio ...
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... Output Short-Circuit Duration to Gnd Storage Temperature Range P, S Package . . . . . . . . . . . . . . . . . . . . . . . –65°C to +150°C Operating Temperature Range OP285G . . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C Junction Temperature Range P, S Package . . . . . . . . . . . . . . . . . . . . . . . –65°C to +150°C Lead Temperature Range (Soldering 60 Sec 300°C CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection ...
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... OP285 +VOM –5 –10 –VOM –15 –20 – SUPPLY VOLTAGE – 15V V = 15V – + –50 – 100 TEMPERATURE – C 120 V = 15V ...
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... FREQUENCY – Hz 300 V = 15V S 250 200 150 100 50 0 –50 – 100 TEMPERATURE – C Typical Performance Characteristics–OP285 100 VCL NEGATIVE EDGE VCL POSITIVE EDGE 15V 100mV p-p ...
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... OP285 250 402 OP AMPS 200 150 100 50 0 –200 –250 –150 –100 – 100 150 200 250 INPUT OFFSET – V 100 200nS Ω ± 80 10.0 V/DIV MKR: 6. 2.5 KHz MKR: 1 000 Hz BW: 15.0 MHz ± ...
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... OP285. Even though the input voltage range of the OP285 is ± 10 input voltage of approximately –13.5 V will cause output voltage phase reversal. In inverting amplifier configurations, the OP285’s internal 7.5 V input clamping diodes will prevent phase reversal ...
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... The test circuit designed to measure + 7A13 PLUG-IN the settling time of the OP285 is shown in Figure 7. This test method has advantages over false-sum node techniques in that the actual output of the amplifier is measured, instead of an – ...
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... This technique relies on the matched frequency characteristics of the two amplifiers in the OP285. Each amplifier in the circuit has the same feedback network which produces a circuit gain of 10. Since the two amplifiers are set to the same gain and are matched due to the monolithic construction of the OP285, they will exhibit identical frequency response ...
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... CMR. The instrumentation amplifier exhibits very wide small- and large-signal bandwidths regardless of the gain setting, as shown in the table. Because of its low noise, wide gain-bandwidth product, and high slew rate, the OP285 is ideally suited for high speed signal conditioning applications. V – V IN1 ...
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... OP285 as an inductance simulator (gyrator). The circuit uses one OP285 (A2 and A3) for the FDNR and one OP285 (Al and A4 input buffer and bias current source for A3. Amplifier A4 is configured in a gain set the pass band magnitude response to 0 dB. The ...
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... OP285 OP285 SPICE Model Node assignments noninverting input inverting input positive supply negative supply .SUBCKT OP285 INPUT STAGE & POLE AT 100 MHZ 2.188 2.188 CIN 1 2 1.5E- 364E- 100E-3 IOS 1 2 1E-9 EOS 9 3 POLY( 35E-6 1 ...
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... R10 R11 D10 G6 G7 OP285 R12 C6 E2 R13 R17 L2 34 OUTPUT R18 ...
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... OP285 0.0098 (0.25) 0.0040 (0.10) OUTLINE DIMENSIONS Dimensions shown in inches and (mm). 8-Lead PDIP Package (N- 0.280 (7.11) 0.240 (6.10 0.070 (1.77) 0.045 (1.15) 0.430 (10.92) 0.348 (8.84) 0.060 (1.52) 0.210 0.015 (0.38) (5.33) MAX 0.150 (3.81) 0.200 (5.05) MIN 0.125 (3.18) SEATING 0.100 0.022 (0.558 PLANE (2.54) 0.014 (0.356) BSC 8-Lead SOIC Package (R- 0.1574 (4.00) ...
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... Revision History Location Data Sheet changed from REV REV. A. Edits to ORDERING GUIDE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Deleted WAFER TEST LIMITS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Deleted DICE CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 OP285 Page ...
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