ATmega32C1 Automotive Atmel Corporation, ATmega32C1 Automotive Datasheet - Page 6

• Manufacturer Part Number: ATmega32C1 Automotive
• Manufacturer: Atmel Corporation

Specifications of ATmega32C1 Automotive

• Flash (kbytes): 32 Kbytes
• Pin Count: 32
• Max. Operating Frequency: 16 MHz
• Cpu: 8-bit AVR
• # Of Touch Channels: 12
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 27
• Ext Interrupts: 27
• Usb Speed: No
• Usb Interface: No
• Spi: 1
• Uart: 1
• Can: 1
• Lin: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 11
• Adc Resolution (bits): 10
• Adc Speed (ksps): 125
• Analog Comparators: 4
• Resistive Touch Screen: No
• Dac Channels: 1
• Dac Resolution (bits): 10
• Temp. Sensor: Yes
• Crypto Engine: No
• Sram (kbytes): 2
• Eeprom (bytes): 1024
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 150
• I/o Supply Class: 2.7 to 5.5
• Operating Voltage (vcc): 2.7 to 5.5
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 2
• Output Compare Channels: 4
• Input Capture Channels: 1
• Pwm Channels: 4
• 32khz Rtc: No
• Calibrated Rc Oscillator: Yes

2. Grade 0 Qualification
The ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has been devel-
oped and manufactured according to the most stringent quality assurance requirements of
ISO-TS-16949 and verified during product qualification as per AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field
usage however may result in less significant stress test acceleration. In order to prevent the risk
that ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 lifetime would not
®
satisfy the application end-of-life reliability requirements, Atmel
has extended the testing,
whenever applicable (High Temperature Operating Life Test, High Temperature Storage Life,
Data Retention, Thermal Cycles), far beyond the AEC-Q100 requirements. Thereby, Atmel veri-
fied the ATmega16M1/ATmega32M1/ATmega32C1/ATmega64M1/ATmega64C1 has a long
safe lifetime period after the grade 0 qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mecha-
nism that is considered. Therefore any temperature mission profile which could exceed the
AEC-Q100 equivalence domain shall be submitted to Atmel for a thorough reliability analysis
Figure 2-1.
AEC-Q100 Lifetime Equivalence
1000000
100000
10000
1000
100
10
1
0
20
40
60
80
100
120
140
160
Temperature (°C)
HTOL 0,59eV
HTSL 0,45eV
ATmega16M1/32M1/32C1/64M1/64C1 Automotive
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