MJ10015 ON Semiconductor, MJ10015 Datasheet - Page 4

• Manufacturer Part Number: MJ10015
• Manufacturer: ON Semiconductor

*Adjust –V such that V
SWITCHING TIMES NOTE
have been defined and apply to both current and voltage
waveforms since they are in phase. However, for inductive
loads which are common to SWITCHMODE power
supplies and hammer drivers, current and voltage
In resistive switching circuits, rise, fall, and storage times
Figure 6. Inductive Switching Measurements
L
R
V
coil
clamp
coil
PW Varied to Attain
I
C
= 10 mH, V
= 0.7
= 100 mA
= V
V
CEO(sus)
CEO(sus)
CC
INDUCTIVE TEST CIRCUIT
= 10 V
BE(off)
= 5 V except as required for RBSOA (Figure 8).
Table 1. Test Conditions for Dynamic Performance
V
CEX
MJ10015 MJ10016
AND INDUCTIVE SWITCHING
INDUCTIVE TEST CIRCUIT
http://onsemi.com
L
R
V
OUTPUT WAVEFORMS
coil
CC
coil
= 180 H
= 20 V
= 0.05
4
waveforms are not in phase. Therefore, separate
measurements must be made on each waveform to
determine the total switching time. For this reason, the
following new terms have been defined.
t
t
t
t
t
storage time and the predominant switching power losses
occur during the crossover interval and can be obtained
using the standard equation from AN–222:
this relationship may not be valid.
switching is specified and has become a benchmark for
designers. However, for designers of high frequency
converter circuits, the user oriented specifications which
make this a “SWITCHMODE” transistor are the inductive
switching speeds (t
sv
rv
fi
ti
c
= Crossover Time, 10% V
For the designer, there is minimal switching loss during
In general, t
As is common with most switching transistors, resistive
= Current Fall Time, 90–10% I
= Current Tail, 10–2% I
= Voltage Rise Time, 10–90% V
= Voltage Storage Time, 90% I
rv
Scope — Tektronix
t
Obtain I
475 or Equivalent
t
t
1
+ t
Test Equipment
1
2
P
Adjusted to
SWT
c
fi
L
L
and t
coil
coil
V
^ t
C
V
Clamp
CC
(I
(I
= 1/2 V
C
C
c
pk
pk
sv
. However, at lower test currents
C
)
)
) which are guaranteed.
clamp
CC
C
to 10% I
B1
I
C
RESISTIVE SWITCHING
clamp
RESISTIVE TEST CIRCUIT
(t
to 10% V
Use inductive switching
the resistive test circuit.
c
driver as the input to
V
R
Pulse Width = 25 s
) f
TURN–OFF TIME
TURN–ON TIME
obtain the forced
CC
L
I
B1
= 12.5
h
= 250 V
FE
C
adjusted to
desired
clamp