MJ10009 ON Semiconductor, MJ10009 Datasheet - Page 4

• Manufacturer Part Number: MJ10009
• Manufacturer: ON Semiconductor

have been defined and apply to both current and voltage
waveforms since they are in phase. However, for inductive
loads which are common to SWITCHMODE power
supplies and hammer drivers, current and voltage
waveforms are not in phase. Therefore, separate
In resistive switching circuits, rise, fall, and storage times
Figure 7. Inductive Switching Measurements
L
R
V
coil
coil
clamp
PW Varied to Attain
I
C
= 10 mH, V
= 0.7
= 100 mA
= V
V
SWITCHING TIMES NOTE
CEO(sus)
CEO(sus)
INDUCTIVE TEST CIRCUIT
CC
= 10 V
V
clamp
For inductive loads pulse width
is adjusted to obtain specified I
Table 1. Test Conditions for Dynamic Performance
= Rated V
DRIVER SCHEMATIC
L
R
V
coil
coil
CC
= 180 H
= 20 V
= 0.05
CEX
Value
RBSOA AND INDUCTIVE SWITCHING
OUTPUT WAVEFORMS
http://onsemi.com
C
MJ10009
4
measurements must be made on each waveform to
determine the total switching time. For this reason, the
following new terms have been defined.
t
t
t
t
t
storage time and the predominant switching power losses
occur during the crossover interval and can be obtained
using the standard equation from AN–222.
Figure 7. In general, t
currents this relationship may not be valid.
switching is specified at 25_C and has become a benchmark
for designers. However, for designers of high frequency
converter circuits, the user oriented specifications which
make this a “SWITCHMODE” transistor are the inductive
switching speeds (t
sv
rv
fi
ti
c
= Crossover Time, 10% V
For the designer, there is minimal switching loss during
Typical inductive switching waveforms are shown in
As is common with most switching transistors, resistive
= Current Fall Time, 90–10% I
= Current Tail, 10–2% I
= Voltage Rise Time, 10–90% V
= Voltage Storage Time, 90% I
[
Scope — Tektronix
475 or Equivalent
t
Obtain I
t
t
1
P
1
2
Test Equipment
Adjusted to
c
SWT
and t
L
L
coil
coil
V
rv
C
V
Clamp
= 1/2 V
CC
(I
(I
+ t
sv
C
C
pk
pk
C
) which are guaranteed at 100_C.
)
)
fi
clamp
] t
CC
c
C
to 10% I
B1
I
. However, at lower test
C
RESISTIVE SWITCHING
clamp
RESISTIVE TEST CIRCUIT
(t
to 10% V
c
Use inductive switching
the resistive test circuit.
) f
driver as the input to
V
R
Pulse Width = 25 s
TURN–OFF TIME
CC
L
obtain the forced
I
= 25
B1
h
= 250 V
C
FE
adjusted to
desired
clamp