DS21354 Dallas Semiconductor, DS21354 Datasheet
DS21354
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DS21354 Summary of contents
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... RELIABILITY REPORT FOR DS21354, Rev B2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com ph: 972-371-3726 fax: 972-371-6016 mbl: 214-435-6610 03/11/2004 ...
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... Failure rate data from the operating life test is reported using a Chi-Squared statistical model at the 60% or 90% confidence level (Cf). The failure rate, Fr, is related to the acceleration during life test by X/(ts * AfV * AfT * Chi-Sq statistical upper limit N = Life test sample size DS21354, Rev B2 ...
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Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate is related to MTTF by: MTTF = 1/Fr NOTE: MTTF is frequently used interchangeably with MTBF. The calculated failure rate for this ...
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UNBIASED MOISTURE RESISTANCE DESCRIPTION DATE CODE HAST, NO BIAS 0336 FAILURE RATE: MTTF (YRS): 9048 CONDITION 130C, 85% R.H. FITS: 12.6 Total: 0 READPOINT QUANTITY FAILS 200 HRS 77 0 Total: 0 ...