NBVSBA037LN1TAG ON Semiconductor, NBVSBA037LN1TAG Datasheet - Page 5

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NBVSBA037LN1TAG

Manufacturer Part Number
NBVSBA037LN1TAG
Description
Manufacturer
ON Semiconductor
Datasheet

Specifications of NBVSBA037LN1TAG

Lead Free Status / Rohs Status
Supplier Unconfirmed
Table 7. PHASE NOISE PERFORMANCE
Table 8. PHASE NOISE PERFORMANCE (continued)
Table 9. RELIABILITY COMPLIANCE
Shock
Solderability
Vibration
Solvent Resistance
Thermal Shock
Moisture Level Sensitivity
Parameter
Parameter
f
f
NOISE
NOISE
Parameter
Output Phase−Noise Performance
Output Phase−Noise Performance
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
Figure 3. Typical Termination for Output Driver and Device Evaluation
Driver
Device
Characteristic
NBVSXXXXX
Characteristic
Q
Q
Mechanical
Mechanical
Mechanical
Mechanical
Environment
Environment
Standard
100 kHz offset
10 MHz offset
Z
Z
http://onsemi.com
100 Hz offset
10 kHz offset
1 MHz offset
1 kHz offset
o
o
Condition
= 50 W
= 50 W
50 W
V
100 kHz offset
5
10 MHz offset
100 Hz offset
10 kHz offset
1 MHz offset
1 kHz offset
TT
Condition
= V
V
DD
122.88
TT
MHZ
−118
−127
−127
−134
−160
−90
011
− 2.0 V
50 W
MIL−STD−833, Method 2002, Condition B
MIL−STD−833, Method 2003
MIL−STD−833, Method 2007, Condition A
MIL−STD−202, Method 215
MIL−STD−833, Method 1011, Condition A
MSL1 260°C per IPC/JEDEC J−STD−020D
148.50
622.08
−127
−127
−134
−160
−106
−122
−150
MHz
−118
MHZ
−117
−117
027
−90
024
−80
IN
IN
155.52
644.53
−116
−126
−126
−134
−160
MHZ
−107
−116
−116
−125
−150
MHz
018
−90
026
−86
Receiver
Device
Method
156.25
693.48
−126
−126
−134
−160
−105
−124
−149
MHZ
−116
MHZ
−115
−115
017
−90
041
−78
200.00
707.35
−114
−125
−125
−132
−158
MHZ
−105
−115
−115
−124
−149
MHz
015
−87
037
−78
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
Units
Units

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