HI1-0546/883 Intersil, HI1-0546/883 Datasheet

HI1-0546/883

Manufacturer Part Number

HI1-0546/883

Description

Analog Multiplexer Single 16:1 28-Pin CDIP

Manufacturer

Intersil

Type

Analog Multiplexerr

Datasheet

1.JM3851019005BEA.pdf (39 pages)

Specifications of HI1-0546/883

Package

28CDIP

Maximum On Resistance

1500@Â±15V Ohm

Maximum Propagation Delay Bus To Bus

700@Â±15V ns

Maximum High Level Output Current

20 mA

Multiplexer Architecture

16:1

Power Supply Type

Single|Dual

Available stocks

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Price

Company:

Bonase Electronics (HK) Co., Limited

Part Number:

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MICRON

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BOSTOCK HK LIMITED

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Current page: 1 of 39
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PMIC N/A

DSCC FORM 2233

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

THIS DRAWING IS AVAILABLE

DEPARTMENT OF DEFENSE

APR 97

AND AGENCIES OF THE

LTR

MICROCIRCUIT

FOR USE BY ALL

STANDARD

DEPARTMENTS

DRAWING

AMSC N/A

Add case outlines, terminal connections and thermal resistance values for case

outlines 2 and 3. For device type 01, 02, and 03, add subgroup 3 to I

test, add R

conditions for t

and t

Add device types 07, 08, and 09. Table I changes. Editorial changes

throughout.

Changes in accordance with NOR 5962-R061-95.

Changes in accordance with NOR 5962-R032-96.

Incorporate NOR’s and current requirements.

Editorial changes throughout. - drw

Make change to the t

and 03 as specified under Table I. - ro

for R

OFF(EN)

DS2

DS1

test, add test condition circuits. Editorial changes throughout.

tests, change value of I

ON(A)

test, add V

PREPARED BY

CHECKED BY

APPROVED BY

DRAWING APPROVAL DATE

REVISION LEVEL

and t

ON(A)

REV

SHEET

RAY MONNIN

D. A. DiCENZO

MARCIA B. KELLEHER

OFF(A)

ISO

and t

test, delete V

DESCRIPTION

OFF(A)

tests, change C

86-06-30

for R

subgroup 9 test limit for devices 01, 02,

DS1

test, change R

test, change value of I

test condition for t

REVISIONS

MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER /

DEMULTIPLEXER, MONOLITHIC SILICON

SHEET

and C

SIZE

ON(EN)

test

DEFENSE SUPPLY CENTER COLUMBUS

and I

and

COLUMBUS, OHIO 43218-3990

CAGE CODE

67268

http://www.dscc.dla.mil

DATE (YR-MO-DA)

1 OF

88-08-26

93-06-28

95-01-25

96-01-09

02-12-30

07-09-13

5962-85131

5962-E563-07

D. A. DiCENZO

APPROVED

M. A. FRYE

R. MONNIN

R. HEBER

Related parts for HI1-0546/883

HI1-0546/883 Summary of contents

Page 1

LTR Add case outlines, terminal connections and thermal resistance values for case outlines 2 and 3. For device type 01, 02, and 03, add subgroup test, add R test, add V DS1 A conditions for t and ...

Page 2

SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-85131 ...

Page 3

Absolute maximum ratings. Supply voltage between +V and -V .............................................................. +44 V Supply voltage between +V and ground: Device types 01-03, 07-09 ....................................................................... +22 V Device types 04-06 .................................................................................. +20 V Supply voltage between -V and ground: Device types ...

Page 4

APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation ...

Page 5

Test Symbol Input leakage current Leakage current into the +I source terminal of an S(OFF) “OFF” switch -I S(OFF) Leakage current into the +I drain terminal of an D(OFF) “OFF” switch See footnotes at end ...

Page 6

TABLE I. Electrical performance characteristics - continued. Test Symbol Leakage current into the -I drain terminal of an D(OFF) “OFF” switch Leakage current from an “ON” driver into the +I D(ON) switch (drain) -I D(ON) See footnotes at end of ...

Page 7

TABLE I. Electrical performance characteristics - continued. Test Symbol Overvoltage protected, +I leakage current into D(OFF the drain terminal of overvoltage an “OFF” switch -I D(OFF) overvoltage +I Positive supply current -I Negative supply current Standby positive +I SBY supply ...

Page 8

TABLE I. Electrical performance characteristics - continued. Test Symbol Switch “ON” resistance +R DS1 -R DS1 +R DS2 3/ -R DS2 3/ Difference in switch ΔR “ON” resistance DS1 between channels Capacitance Address See footnotes at end of ...

Page 9

TABLE I. Electrical performance characteristics - continued. Test Symbol C Capacitance: OS Output switch C Capacitance: IS Input switch V Charge transfer error CTE Off isolation V ISO Single channel isolation V ISO Crosstalk between V CT channels Break-before-make t ...

Page 10

TABLE I. Electrical performance characteristics - continued. Test Symbol t Propagation delay times: ON(A) Address inputs to I/O channels times: t OFF(A) t Enable to I/O ON(EN) t OFF(EN) 1/ For device types 01 and 02, V REF device types ...

Page 11

Case E X outlines Device 03, 06, 01 types 09 Terminal number Enable ...

Page 12

Device types 01, 04, and ...

Page 13

FIGURE 3. Break-before-make test circuit and waveforms. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL F 5962-85131 SHEET 13 ...

Page 14

FIGURE 3. Break-before-make test circuit and waveforms – continued. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE A REVISION LEVEL F 5962-85131 SHEET 14 ...

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STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 FIGURE 4. Switching times test circuits. SIZE A 5962-85131 REVISION LEVEL SHEET F 20 ...

Page 21

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 FIGURE 4. Switching times test circuits – continued. SIZE A 5962-85131 REVISION LEVEL SHEET F 21 ...

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GND +10 V -10 V -10 V +10 V GND 1k +10 V -10 V GND STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR + OUT A 2 ...

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Page 36

VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality ...

Page 37

MIL-STD-883 test requirements Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) Group A test requirements (method 5005) Groups C and D end-point electrical parameters (method 5005) * PDA applies to subgroup 1. ** Subgroups 10 and 11, ...

Page 38

... HI4-547/883 34371 HI1-547/883 3/ HI4-549/883 34371 HI1-549/883 3/ IH5116MJI 3/ IH5216MJI 1ES66 MAX359MLP/883B 1ES66 MAX359MJE/883B 3/ IH5208MJE 34371 HI4-506/883 1ES66 DG506AAZ/883B 34371 HI1-506/883 3/ HI4-507/883 1ES66 DG507AAZ/883B 3/ HI1-507/883 34371 HI4-509/883 1ES66 DG509AAZ/883B 3/ HI1-509/883 Reference military specification M38510/19002BXA M38510/19004BXA M38510/19006BEA M38510/19002BXA M38510/19004BXA M38510/19006BEA M38510/19001BXA M38510/19003BXA M38510/19008BEA ...

Page 39

... The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. Vendor name and address Intersil Corporation 1001 Murphy Ranch Road Milpitas, CA 95035-6803 Point of contact: 1650 Robert J. Conlan Blvd. Palm Bay, FL 32905 ...

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