STM32L151C6U6 STMicroelectronics, STM32L151C6U6 Datasheet - Page 71
![no-image](/images/manufacturer_photos/0/6/637/stmicroelectronics_sml.jpg)
STM32L151C6U6
Manufacturer Part Number
STM32L151C6U6
Description
IC MCU 32BIT 32KB FLASH 48QFPN
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet
1.STM32L152-EVAL.pdf
(107 pages)
Specifications of STM32L151C6U6
Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
32MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, I²S, POR, PWM, WDT
Number Of I /o
37
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
10K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 16x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-UFQFN Exposed Pad
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
497-11486
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STM32L151C6U6
Manufacturer:
STMicroelectronics
Quantity:
10 000
STM32L151xx, STM32L152xx
6.3.10
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 34.
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 35.
1. Based on characterization results, not tested in production.
V
V
Symbol Parameter
Symbol
ESD(HBM)
ESD(CDM)
S
EMI
Peak level
Electrostatic discharge
voltage (human body model)
Electrostatic discharge
voltage (charge device model)
EMI characteristics
ESD absolute maximum ratings
Ratings
V
T
LQFP100 package
compliant with IEC
61967-2
A
DD
25 °C,
Conditions
3.3 V,
Doc ID 17659 Rev 4
T
to JESD22-A114
T
to JESD22-C101
A
A
0.1 to 30 MHz
30 to 130 MHz
130 MHz to 1GHz
SAE EMI Level
+25 °C, conforming
+25 °C, conforming
frequency band
Conditions
Monitored
range 3
voltage
Max vs. frequency range
4 MHz
2.5
18
15
Class Maximum value
3
2
II
Electrical characteristics
range 2
16 MHz
voltage
-6
5
4
2
2000
500
range 1
32 MHz
voltage
-7
-5
-7
1
(1)
dBµV
71/107
Unit
Unit
-
V