LH28F800SGN-L70 Sharp Electronics, LH28F800SGN-L70 Datasheet - Page 32

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LH28F800SGN-L70

Manufacturer Part Number
LH28F800SGN-L70
Description
Manufacturer
Sharp Electronics
Datasheet

Specifications of LH28F800SGN-L70

Cell Type
NOR
Density
8Mb
Interface Type
Parallel
Boot Type
Not Required
Address Bus
19b
Operating Supply Voltage (typ)
3.3/5V
Operating Temp Range
0C to 70C
Package Type
SOP
Program/erase Volt (typ)
2.7/3.3/5/12V
Sync/async
Asynchronous
Operating Temperature Classification
Commercial
Operating Supply Voltage (min)
2.7/4.5V
Operating Supply Voltage (max)
3.6/5.5V
Word Size
16b
Number Of Words
512K
Supply Current
65mA
Mounting
Surface Mount
Pin Count
44
Lead Free Status / Rohs Status
Not Compliant
6.2.5 AC CHARACTERISTICS FOR WE#-CONTROLLED WRITE OPERATIONS
NOTES :
1. Read timing characteristics during block erase, word
2. Sampled, not 100% tested.
SYMBOL
SYMBOL
• V
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
AVAV
PHWL
ELWL
WLWH
PHHWH
VPWH
AVWH
DVWH
WHDX
WHAX
WHEH
WHWL
WHRL
WHGL
QVVL
QVPH
AVAV
PHWL
ELWL
WLWH
PHHWH
VPWH
AVWH
DVWH
WHDX
WHAX
WHEH
WHWL
WHRL
WHGL
QVVL
QVPH
V
CC
CC
write and lock-bit configuration operations are the same
as during read-only operations. Refer to Section 6.2.4
"AC CHARACTERISTICS" for read-only operations.
= 2.7 to 3.0 V, T
= 3.3±0.3 V, T
Write Cycle Time
RP# High Recovery to WE# Going Low
CE# Setup to WE# Going Low
WE# Pulse Width
RP# V
V
Address Setup to WE# Going High
Data Setup to WE# Going High
Data Hold from WE# High
Address Hold from WE# High
CE# Hold from WE# High
WE# Pulse Width High
WE# High to RY/BY# Going Low
Write Recovery before Read
V
RP# V
Write Cycle Time
RP# High Recovery to WE# Going Low
CE# Setup to WE# Going Low
WE# Pulse Width
RP# V
V
Address Setup to WE# Going High
Data Setup to WE# Going High
Data Hold from WE# High
Address Hold from WE# High
CE# Hold from WE# High
WE# Pulse Width High
WE# High to RY/BY# Going Low
Write Recovery before Read
V
RP# V
PP
PP
PP
PP
Setup to WE# Going High
Hold from Valid SRD, RY/BY# High
Setup to WE# Going High
Hold from Valid SRD, RY/BY# High
HH
HH
HH
HH
Hold from Valid SRD, RY/BY# High
Setup to WE# Going High
Hold from Valid SRD, RY/BY# High
Setup to WE# Going High
A
= 0 to +70˚C
A
= 0 to +70
PARAMETER
PARAMETER
VERSIONS
VERSIONS
˚
C
- 32 -
NOTE
NOTE
2, 4
2, 4
2, 4
2, 4
2
2
2
3
3
2
2
2
3
3
3. Refer to Table 3 for valid A
4. V
word write, or lock-bit configuration.
should be held at V
word write, or lock-bit configuration success (SR.1/3/4/5 = 0).
PP
LH28F800SG-L70
LH28F800SG-L70
MIN.
MIN.
100
100
100
100
100
10
50
50
50
10
30
85
10
50
50
50
10
30
1
5
5
0
1
5
5
0
0
0
0
0
should be held at V
MAX.
MAX.
100
100
LH28F800SG-L (FOR SOP)
HH
) until determination of block erase,
PPH1/2/3
LH28F800SG-L10
LH28F800SG-L10
MIN.
MIN.
120
100
100
100
100
100
IN
10
50
50
50
10
30
10
50
50
50
10
30
1
5
5
0
0
0
1
5
5
0
0
0
and D
(and if necessary RP#
(NOTE 1)
IN
for block erase,
MAX.
MAX.
100
100
UNIT
UNIT
ns
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns

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