LH28F800SGE-L10 Sharp Electronics, LH28F800SGE-L10 Datasheet - Page 4

no-image

LH28F800SGE-L10

Manufacturer Part Number
LH28F800SGE-L10
Description
Manufacturer
Sharp Electronics
Datasheet

Specifications of LH28F800SGE-L10

Cell Type
NOR
Density
8Mb
Access Time (max)
100ns
Interface Type
Parallel
Boot Type
Not Required
Address Bus
19b
Operating Supply Voltage (typ)
5V
Operating Temp Range
0C to 70C
Package Type
TSOP-I
Program/erase Volt (typ)
2.7/3.3/5/12V
Sync/async
Asynchronous
Operating Temperature Classification
Commercial
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Word Size
16b
Number Of Words
512K
Supply Current
65mA
Mounting
Surface Mount
Pin Count
48
Lead Free Status / Rohs Status
Not Compliant
PIN DESCRIPTION
DQ
SYMBOL
RY/BY#
A
RP#
WE#
WP#
GND
CE#
OE#
V
V
0
0
NC
-DQ
-A
CC
PP
18
15
OUTPUT
OUTPUT
SUPPLY
SUPPLY
SUPPLY
INPUT/
INPUT
INPUT
INPUT
INPUT
INPUT
INPUT
TYPE
ADDRESS INPUTS : Inputs for addresses during read and write operations. Addresses
are internally latched during a write cycle.
DATA INPUT/OUTPUTS : Inputs data and commands during CUI write cycles; outputs
data during memory array, status register, and identifier code read cycles. Data pins
float to high-impedance when the chip is deselected or outputs are disabled. Data is
internally latched during a write cycle.
CHIP ENABLE : Activates the device's control logic, input buffers, decoders, and sense
amplifiers. CE#-high deselects the device and reduces power consumption to standby
levels.
RESET/DEEP POWER-DOWN : Puts the device in deep power-down mode and resets
internal automation. RP#-high enables normal operation. When driven low, RP# inhibits
write operations which provide data protection during power transitions. Exit from deep
power-down sets the device to read array mode.
RP# at V
configuration with V
attempted.
OUTPUT ENABLE : Controls the device's outputs during a read cycle.
WRITE ENABLE : Controls writes to the CUI and array blocks. Addresses and data are
latched on the rising edge of the WE# pulse.
WRITE PROTECT : Master control for block locking. When V
erased and programmed, and block lock-bits can not be set and reset.
READY/BUSY : Indicates the status of the internal WSM. When low, the WSM is
performing an internal operation (block erase, word write, or lock-bit configuration).
RY/BY#-high indicates that the WSM is ready for new commands, block erase is
suspended, and word write is inactive, word write is suspended, or the device is in deep
power-down mode. RY/BY# is always active and does not float when the chip is
deselected or data outputs are disabled.
BLOCK ERASE, WORD WRITE, LOCK-BIT CONFIGURATION POWER SUPPLY :
For erasing array blocks, writing words, or configuring lock-bits. With V
memory contents cannot be altered. Block erase, word write, and lock-bit configuration
with an invalid V
results and should not be attempted.
DEVICE POWER SUPPLY : Internal detection configured the device for 2.7 V, 3.3 V or
5 V operation. To switch from one voltage to another, ramp V
ramp V
attempts to the flash memory are inhibited. Device operations at invalid V
(see Section 6.2.3 "DC CHARACTERISTICS") produce spurious results and should
not be attempted.
GROUND : Do not float any ground pins.
NO CONNECT : Lead is not internal connected; recommend to be floated.
CC
HH
to the new voltage. Do not float any power pins. With V
allows to set permanent lock-bit. Block erase, word write, or lock-bit
PP
(see Section 6.2.3 "DC CHARACTERISTICS") produce spurious
IH
< RP# < V
- 4 -
NAME AND FUNCTION
HH
LH28F800SG-L/SGH-L (FOR TSOP, CSP)
produce spurious results and should not be
IL
CC
, locked blocks cannot be
down to GND and then
CC
≤ V
LKO
PP
CC
, all write
≤ V
voltage
PPLK
,

Related parts for LH28F800SGE-L10