LFXP2-30E-6FT256I Lattice, LFXP2-30E-6FT256I Datasheet - Page 77
LFXP2-30E-6FT256I
Manufacturer Part Number
LFXP2-30E-6FT256I
Description
IC FPGA 30KLUTS 201I/O 256-BGA
Manufacturer
Lattice
Datasheet
1.LFXP2-40E-5FN484I.pdf
(92 pages)
Specifications of LFXP2-30E-6FT256I
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LFXP2-30E-6FT256I
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
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Lattice Semiconductor
Switching Test Conditions
Figure 3-11 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3-6.
Figure 3-11. Output Test Load, LVTTL and LVCMOS Standards
Table 3-6. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*CL Includes Test Fixture and Probe Capacitance
DUT
V
R1
R2
T
1M
100
R
1
3-33
1M
100
R
CL*
2
Test Poi nt
0pF
C
DC and Switching Characteristics
L
LatticeXP2 Family Data Sheet
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.10
- 0.10
/2
/2
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
CCIO
CCIO
V
—
—
—
—
—
—
—
T
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