MC33390D Freescale Semiconductor, MC33390D Datasheet - Page 4

• Manufacturer Part Number: MC33390D
• Description: IC TRANSCEIVER SER LINK 8-SOIC
• Manufacturer: Freescale Semiconductor
• Type: Transceiverr

Specifications of MC33390D

• Number Of Drivers/receivers: 1/1
• Voltage - Supply: 9 V ~ 16 V
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Protocol: -
• Other names: Q1163428B

Table 2. Maximum Ratings
permanent damage to the device.
4
33390
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Notes
VBAT DC Supply Voltage
Input I/O Pins
BUS and LOAD Outputs
ESD Voltage
Storage Temperature
Operating Ambient Temperature
Operating Junction Temperature
Peak Package Reflow Temperature During Reflow
Thermal Resistance (Junction-to-Ambient)
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
1.
2.
3.
4.
5.
Human Body Model
Machine Model
An external series diode must be used to provide reverse battery protection of the device.
SLEEP
ESD1 testing is performed in accordance with the Human Body Model (C
accordance with the Machine Model (C
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL),
Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e.
MC33xxxD enter 33xxx), and review parametrics.
, TX, RX, and 4X / LOOP are normally connected to a microcontroller.
(3)
(2)
(1)
Ratings
ELECTRICAL CHARACTERISTICS
ZAP
= 200 pF, R
(4)
,
(5)
MAXIMUM RATINGS
ZAP
= 0 Ω).
ZAP
= 100 pF, R
V
Symbol
V
V
I/O(CPU)
T
V
R
V
T
ESD1
ESD2
PPRT
T
BUS
STG
T
θ
BAT
J-A
A
J
ZAP
Analog Integrated Circuit Device Data
= 1500 Ω), ESD2 testing is performed in
-0.3 to 7.0
-65 to 150
-40 to 125
-40 to 150
-0.3 to 40
-2.0 to 16
Note 5.
±2000
Value
±200
180
Freescale Semiconductor
°C / W
Unit
°C
°C
°C
°C
V
V
V
V