ADE7566ASTZF8 Analog Devices Inc, ADE7566ASTZF8 Datasheet - Page 67

• Manufacturer Part Number: ADE7566ASTZF8
• Description: IC ENERGY METER MCU 8K 64LQFP
• Manufacturer: Analog Devices Inc

Specifications of ADE7566ASTZF8

• Applications: Energy Measurement
• Core Processor: 8052
• Program Memory Type: FLASH (8 kB)
• Controller Series: ADE75xx
• Ram Size: 512 x 8
• Interface: I²C, SPI, UART
• Number Of I /o: 20
• Voltage - Supply: 3.135 V ~ 3.465 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 64-LQFP
• Ic Function: Single Phase Energy Measurement IC
• Supply Voltage Range: 3.13V To 3.46V, 2.4V To 3.7V
• Operating Temperature Range: -40°C To +85°C
• Digital Ic Case Style: LQFP
• No. Of Pins: 64
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Preliminary Technical Data
TEMPERATURE MEASUREMENT
To provide a digital temperature measurement, each
ADE7566/ADE7569 includes a dedicated ADC. An 8-bit
Temperature ADC Value SFR (TEMPADC, 0xD7) holds the
results of the temperature conversion. The resolution of the
temperature measurement is 0.78°C/LSB. There are two ways to
initiate a temperature conversion: a single temperature
measurement or background temperature measurements.
Single Temperature Measurement
Set the TEMP_ADC_GO bit in the Start ADC Measurement
SFR (ADCGO, 0xD8) to obtain a temperature measurement.
An interrupt is generated when the conversion is complete and
when the temperature measurement is available in the
Temperature ADC Value SFR (TEMPADC, 0xD7).
Background Temperature Measurements
Background temperature measurements are disabled by default.
To configure the background temperature measurement mode,
set a temperature measurement interval in the Peripheral ADC
Strobe Period SFR (STRBPER, 0xF9). Temperature
measurements are then performed periodically in the background
(see Table 45).
When a temperature conversion completes, the new temperature
ADC value is compared to the last temperature ADC value that
created an interrupt. If the absolute difference between the two
values is greater than the setting in the TEMP_DIFF[2:0] bits in
the Temperature and Supply Delta SFR (DIFFPROG, 0xF3), a
TEMPADC interrupt is generated. This allows temperature
measurements to take place completely in the background, only
requiring MCU activity if the temperature has changed more
than a configurable delta.
To set up background temperature measurements, follow these
steps:
1.
2.
3.
Temperature ADC in PSM0, PSM1, and PSM2
Depending on the operating mode of the ADE7566/ADE7569,
a temperature conversion is initiated only by certain actions.
•
•
Initiate a single temperature measurement by setting the
TEMP_ADC_GO bit in the Start ADC Measurement SFR
(ADCGO, 0xD8).
Upon completion of this measurement, configure the
TEMP_DIFF[2:0] bits to establish the change in temperature
that triggers an interrupt.
Set up the interval for background temperature measurements
by configuring the TEMP_PERIOD[1:0] bits in the
Peripheral ADC Strobe Period SFR (STRBPER, 0xF9).
In PSM0 operating mode, the 8052 is active. Temperature
measurements are available in the background measurement
mode and by initiating a single measurement.
In PSM1 operating mode, the 8052 is active and the part
is battery powered. Single temperature measurements
can be initiated by setting the TEMP_ADC_GO bit in the
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•
The Temperature ADC Value SFR (TEMPADC, 0xD7) is
updated with a new value only when a temperature ADC
interrupt occurs.
Temperature ADC Interrupt
The temperature ADC can generate an ADC interrupt when at
least one of the following conditions occurs:
•
•
When the ADC interrupt occurs, a new value is available in the
Temperature ADC Value SFR (TEMPADC, 0xD7). Note that
there is no flag associated with this interrupt.
BATTERY MEASUREMENT
To provide a digital battery measurement, each
ADE7566/ADE7569 includes a dedicated ADC. The battery
measurement is available in an 8-bit SFR (Battery ADC Value
SFR (BATADC, 0xDF)). The battery measurement has a
resolution of 15 mV/LSB. A battery conversion can be initiated
by two methods: a single battery measurement or background
battery measurements.
Single Battery Measurement
Set the BATT_ADC_GO bit in the Start ADC Measurement
SFR (ADCGO, 0xD8) to obtain a battery measurement. An
interrupt is generated when the conversion is done and when
the battery measurement is available in the Battery ADC Value
SFR (BATADC, 0xDF).
Background Battery Measurements
To configure background measurements for the battery,
establish a measurement interval in the Peripheral ADC Strobe
Period SFR (STRBPER, 0xF9). Battery measurements are then
performed periodically in the background (see Table 45).
When a battery conversion completes, the battery ADC value is
compared to the low battery threshold, established in the
Battery Detection Threshold SFR (BATVTH, 0xFA). If the
battery ADC value is below this threshold, a low battery flag is
set. This low battery flag is the FBAT bit in the Power
Management Interrupt Flag SFR (IPSMF, 0xF8), which is used
for power supply monitoring. This low battery flag can be
enabled to generate the PSM interrupt by setting the EBAT bit
in the Power Management Interrupt Enable SFR (IPSME,
0xEC). This method allows battery measurements to take place
completely in the background, only requiring MCU activity if
the battery drops below a user-specified threshold.
Start ADC Measurement SFR (ADCGO, 0xD8).
Background temperature measurements are not available.
In PSM2 operating mode, the 8052 is not active.
Temperature conversions are available through the
background measurement mode only.
The difference between the new temperature ADC value and
the last temperature ADC value generating an ADC interrupt
is larger than the value set in the TEMP_DIFF[2:0] bits.
The temperature ADC conversion, initiated by setting Start
ADC Measurement SFR (ADCGO, 0xD8) finishes.
ADE7566/ADE7569