EPF8452ATC100-4N Altera, EPF8452ATC100-4N Datasheet - Page 27

IC FLEX 8000 FPGA 4K 100-TQFP

EPF8452ATC100-4N

Manufacturer Part Number
EPF8452ATC100-4N
Description
IC FLEX 8000 FPGA 4K 100-TQFP
Manufacturer
Altera
Series
FLEX 8000r
Datasheet

Specifications of EPF8452ATC100-4N

Number Of Logic Elements/cells
336
Number Of Labs/clbs
42
Number Of I /o
68
Number Of Gates
4000
Voltage - Supply
4.75 V ~ 5.25 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 70°C
Package / Case
100-TQFP, 100-VQFP
Family Name
FLEX 8000
Number Of Usable Gates
4000
Number Of Logic Blocks/elements
336
# Registers
452
# I/os (max)
68
Frequency (max)
125MHz
Process Technology
CMOS
Operating Supply Voltage (typ)
5V
Logic Cells
336
Device System Gates
4000
Operating Supply Voltage (min)
4.75V
Operating Supply Voltage (max)
5.25V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
100
Package Type
TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Total Ram Bits
-
Lead Free Status / Rohs Status
Compliant
Other names
544-1783

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
EPF8452ATC100-4N
Manufacturer:
Altera
Quantity:
10 000
Part Number:
EPF8452ATC100-4N
Manufacturer:
ALTERA
Quantity:
100
Part Number:
EPF8452ATC100-4N
Manufacturer:
ALTERA
0
Operating
Conditions
Altera Corporation
Symbol
V
V
I
T
T
T
Table 9. FLEX 8000 5.0-V Device Absolute Maximum Ratings
OUT
STG
AMB
J
CC
I
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Parameter
Figure 15. FLEX 8000 AC Test Conditions
Tables 9
recommended operating conditions, operating conditions, and
capacitance for 5.0-V FLEX 8000 devices.
Power supply transients can affect AC
measurements. Simultaneous transitions
of multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in parentheses are for 3.3-V
devices or outputs. Numbers without
parentheses are for 5.0-V devices or
outputs.
through
No bias
With respect to ground
Under bias
Ceramic packages, under bias
PQFP and RQFP, under bias
FLEX 8000 Programmable Logic Device Family Data Sheet
12
provide information on absolute maximum ratings,
Conditions
(2)
Note (1)
Device
Output
Device input
rise and fall
times < 3 ns
(8.06 K )
(703 )
250
464
–2.0
–2.0
Min
–25
–65
–65
C1 (includes
JIG capacitance)
Max
150
135
150
135
7.0
7.0
25
To Test
System
VCC
Unit
mA
° C
° C
° C
° C
V
V
27
3

Related parts for EPF8452ATC100-4N