54ACQ245LMQB. National Semiconductor, 54ACQ245LMQB. Datasheet
54ACQ245LMQB.
Specifications of 54ACQ245LMQB.
Related parts for 54ACQ245LMQB.
54ACQ245LMQB. Summary of contents
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LTR A Change limits for V . Editorial changes throughout. - jak OL B Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. – jak REV SHEET REV B B SHEET 15 16 REV STATUS REV ...
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SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected ...
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Absolute maximum ratings Supply voltage range (V ) ........................................................................... -0 +7 input voltage range (V ) ......................................................................... -0 output voltage range (V OUT ...
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APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation ...
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Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. ...
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Test and Symbol MIL-STD-883 test method 1/ High level output voltage V OH 3006 Low level output voltage V OL 3007 Positive input clamp voltage V IC+ 3022 Negative input clamp voltage V IC- 3022 Three-state output leakage I OZH ...
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TABLE I. Electrical performance characteristics – Continued. Test and Symbol MIL-STD-883 test method 1/ Input capacitance C IN 3012 Input/output capacitance C I/O 3012 5/ Power dissipation C PD capacitance 6/ Low level ground bounce V OLP noise 7/ V ...
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TABLE I. Electrical performance characteristics – Continued. 1/ For tests not listed in the referenced MIL-STD-883 (e.g. I herein. All inputs and outputs shall be tested, as applicable, to the tests in table I herein. 2/ Each input/output, as applicable, ...
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Terminal number Terminal symbol T/R STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Device type 01 Case outlines R, S, ...
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L = Low voltage level H = High voltage level X = Irrelevant 1/ During isolation , the A and B buses are both in the high-impedance state. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM ...
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NOTES includes chip capacitor (-0 percent, +20 percent) and at least equivalent capacitance from the test jig L and probe. = 450Ω ±1 percent, chip resistor in series with a 50Ω termination. ...
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NOTES: 1. When measuring t and t PLZ PZL 2. When measuring PHZ PZH PLH 3. The t and t reference waveform is for the output under test with internal conditions such that the output ...
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VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall ...
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Group A inspection. a. Tests shall be as specified in table II herein. b. Ground and V bounce tests are required for all device classes. These tests shall be performed only for initial CC qualification, after process or design ...
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Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall ...
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NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by ...
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... DATE: 07-02-21 Standard Vendor CAGE PIN 1/ number 27014 0C7V7 27014 0C7V7 27014 0C7V7 Vendor name and address National Semiconductor 2900 Semiconductor Drive P.O. Box 58090 Santa Clara, CA 95052-8090 QP Semiconductor 2945 Oakmead Village Court Santa Clara, CA 95051 Vendor similar PIN 2/ 54ACQ245DMQB 54ACQ245FMQB 54ACQ245LMQB ...