M38510/76302BEA QP SEMICONDUCTOR, M38510/76302BEA Datasheet - Page 5

• Manufacturer Part Number: M38510/76302BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/76302BEA

• Lead Free Status / Rohs Status: Supplier Unconfirmed

over the full recommended case operating temperature range, unless otherwise specified.
table II. The electrical tests for each subgroup are described in table III.
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the
form, fit, or function as described herein.
qualification and quality conformance inspection. The following additional criteria shall apply:
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 12
(see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-
PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
prior to burn-in is optional at the discretion of the manufacturer.
MIL-M-38510/315D
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