JD54LS164BCA National Semiconductor, JD54LS164BCA Datasheet
JD54LS164BCA
Specifications of JD54LS164BCA
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JD54LS164BCA Summary of contents
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MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, SHIFT REGISTERS, CASCADABLE, MONOLITHIC SILICON This specification is approved for use by all Departments 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, low power, shift register microcircuits. Two ...
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Case outlines. The case outlines should be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator A GDFP5-F14 or CDFP6-F14 B GDFP4-14 C GDIP1-T14 or CDIP2-T14 D GDFP1-F14 or CDFP2-F14 E GDIP1-T16 or CDIP2-T16 F GDFP2-F16 or ...
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Minimum setup time at shift/load: Device type 02 .................................................................................. 25 ns Device type 07 .................................................................................. 20 ns Device type 08 .................................................................................. 42 ns Device type 09 .................................................................................. 30 ns Minimum setup time at serial data: Device type 08 .................................................................................. 10 ...
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REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.4). 3.2 Item ...
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Test Symbol High-level output V OH voltage Low-level output V OL voltage Input clamp voltage V IC High-level input I IH1 current for all inputs except S/L I IH2 for type 08 High-level input I IH3 current at any input ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol Off-state output I OZH current, high level voltage applied Off-state output I OZL current, low level voltage applied Low-level input I IL1 current (for all inputs except S/L, serial in & ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol Supply current I CC Maximum shift f MAX frequency Propagation delay t PLH1 time, low-to-high level from clock See footnotes at end of table. MIL-M-38510/306E Conditions 1/ -55 C < T ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol Propagation delay t PLH2 time, low-to-high level form preset or preset enable Propagation delay t PLH1 time, high-to-low level from clock Propagation delay t PLH2 time, high-to-low level from clear Propagation ...
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TABLE I. Electrical performance characteristics - Continued. Test Symbol Propagation delay t PLH4 time, low to high level from data Propagation delay t PHL4 time, high to low level from data Output enable time low level Output ...
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MIL-M-38510/306E TABLE II. Electrical test requirements. MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group B test when using the method 5005 QCI option. Group C end-point electrical parameters Group D end-point electrical parameters ...
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Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535 . 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL- PRF-38535 and herein for groups and D inspections (see 4.4.1 through ...
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Device type 01 Pin 2, X E,F number 1 NC CLEAR 2 CLEAR SHF RHT SER INP 3 SHF RHT A SER INP SHF LEFT SER INP 8 D ...
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Device type 05 Pin 2, X A,B,C, number and SER INP GND 8 QC CLK 9 QD CLR 10 ...
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MIL-M-38510/306E Device type 09 Pin 2, X number SERIAL INPUT CLOCK INHIBIT 9 CLK 10 GND CLR ...
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MODE CLEAR CLOCK S1 S0 LEFT high level (steady state) L ...
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SHIFT/ CLEAR CLOCK LOAD high level (steady state low level (steady state) ...
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MODE CLOCKS SERIAL CONTROL 2 ( ↓ ↓ ↓ ↓ ↓ ↓ Shifting ...
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INPUTS PRESET CLEAR ENABLE ...
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CLEAR CLOCK high level (steady state low level (steady state irrelevant (any input, including transitions) = transition from low to high level the level ...
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MODE CLOCK SERIAL CONTROL ↓ H ↓ ↓ L ↓ When the output control is low, the outputs are disabled to high impedance state. however, sequential operation of the registers is not affected. + ...
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Inputs Shift/ Clock Clock load inhibit High level (steady state Low level (steady state Irrelevant (any input, including transitions) = Transition ...
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Shift/ Clock Clear load inhibit High level (steady state Low level (steady state Irrelevant (any input, ...
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MIL-M-38510/306E FIGURE 3. Logic diagrams. 23 ...
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FIGURE 3. Logic diagrams - Continued. MIL-M-38510/306E 24 ...
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MIL-M-38510/306E FIGURE 3. Logic diagrams - Continued. 25 ...
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MIL-M-38510/306E FIGURE 3. Logic diagram - Continued. 26 ...
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MIL-M-38510/306E FIGURE 3. Logic diagrams - Continued. 27 ...
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MIL-M-38510/306E Pin numbers are for cases E and F only. FIGURE 3. Logic diagrams - Continued. 28 ...
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MIL-M-38510/306E FIGURE 3. Logic diagrams - Continued. 29 ...
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MIL-M-38510/306E Device Type 09 Pin numbers are for cases E and F only. FIGURE 3. Logic diagrams - Continued. 30 ...
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MIL-M-38510/306E FIGURE 4. Switching test circuit and waveforms for device type 01. 31 ...
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NOTES: 1. Clock pulse characteristics: PRR t 6 ns, t (clock) 20 ns. THL p 2. Serial or data pulse characteristics ns ns, t SETUP HOLD p 3. Clear pulse characteristics: t THL ...
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MIL-M-38510/306E FIGURE 5. Switching test circuit and waveforms for device type 02. 33 ...
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MIL-M-38510/306E FIGURE 5. Switching test circuit and waveforms for device type 02 - Continued. 34 ...
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NOTES: 1. Clock pulse characteristics: PRR t 6 ns, t (clock) 18 ns. TLH p 2. Data pulse characteristics: t TLH ns ns, t SETUP HOLD DATA 3. Clear pulse characteristics: t TLH 4. ...
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MIL-M-38510/306E FIGURE 6. Switching test circuit and waveforms for device type 03. 36 ...
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MIL-M-38510/306E FIGURE 6. Switching test circuit and waveforms for device type 03 - Continued. 37 ...
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NOTES: 1. Clock pulse characteristics: PRR t 6 ns, t (clock) 20 ns. THL p 2. Serial data pulse characteristics (SER (DATA ns percent including ...
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MIL-M-38510/306E FIGURE 7. Switching test circuit and waveforms for device type 04. 39 ...
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MIL-M-38510/306E FIGURE 7. Switching test circuit and waveforms for device type 04 - Continued. 40 ...
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NOTES: 1. Clock pulse characteristics: PRR t 6 ns, t (clock) 25 ns. THL p 2. Serial data pulse characteristics ns Clear, data, and enable pulse characteristics ns ...
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MIL-M-38510/306E FIGURE 8. Switching test circuit and waveforms for device type 05. 42 ...
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MIL-M-38510/306E FIGURE 8. Switching test circuit and waveforms for device type 05 - Continued. 43 ...
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NOTES: 1. Clock pulse characteristics: PRR t 6 ns, t (clock) THL p 2. Clear pulse characteristics: t (clear ns. 3. Serial pulse characteristics: t (serial ns percent including ...
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MIL-M-38510/306E FIGURE 9. Switching test circuit and waveforms for device type 06. 45 ...
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Acrobat Document FIGURE 9. Switching test circuit and waveforms for device type 06 - Continued. MIL-M-38510/306E 46 ...
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MIL-M-38510/306E FIGURE 9. Switching test circuit and waveforms for device type 06 - Continued. 47 ...
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NOTES: 1. Clock pulse characteristics: PRR 2. Data or serial pulse characteristics ns ns ns. SETUP HOLD 3. Output control characteristics: t except when optional load is used ...
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MIL-M-38510/306E FIGURE 10. Switching test circuit and waveforms for device type 07. 49 ...
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MIL-M-38510/306E FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued. 50 ...
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MIL-M-38510/306E FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued. 51 ...
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MIL-M-38510/306E FIGURE 10. Switching test circuit and waveforms for device type 07 - Continued. 52 ...
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NOTES: 1. Clock pulse characteristics: PRR 2. Data or serial pulse characteristics ns ns ns. SETUP HOLD 3. Clear pulse characteristics: t TLH for t test Output control pulse ...
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MIL-M-38510/306E FIGURE 11. Switching test circuit and waveforms for device type 08. 54 ...
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MIL-M-38510/306E FIGURE 11. Switching test circuit and waveforms for device type 08 - Continued. 55 ...
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NOTES: 1. For t measurements, internal output G must be set to a low and Q PHL2 to tests. 2. For t measurements, internal output G must be set to a high and Q PHL2 to test ...
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MIL-M-38510/306E FIGURE 12. Switching test circuit and waveforms for device type 09. 57 ...
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NOTES 2 10%, which includes probe, and jug capacitance All pulse generators have the following characteristics and PRR 1 MHz All ...
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MIL- Cases E Subgroup Symbol STD- Cases 2 883 Test no. CLR S method Serial 1 V 3006 1 A GND 2 " " GND ...
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MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLR S/R Serial 1 I 3009 44 0.4 V IL1 0.4 V IL2 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. CLR S/R Serial Truth 3014 table 60 " ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLR S/R Serial 8 Same tests, terminal conditions, and limits as subgroup 7, except T ...
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FOOTNOTES: A. Apply input pulse: 2.5 V minimum/5.5 V maximum 2 0 Test numbers 59 through 111 shall be run in sequence. E. Output voltages shall be ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. CLR 3005 1 B 2 ...
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MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLR 3009 38 0.4 V IL1 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. CLR Truth 3014 table 55 " ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLR 3003 105 J J PHL1 (Fig. 5) ...
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FOOTNOTES: A. Apply input pulse: 2.5 V minimum/5.5 V maximum Apply input pulse: 2.5 V minimum/5.5 V maximum 2 0 Test numbers 54 through ...
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Terminal conditions (pins not designated may be high MIL- Cases 1 2 STD- A,B,C,D 883 Subgroup Symbol Cases 2 method Test no. Serial 3006 1 2.0 V GND GND OH 2 2.0 V 2.0 ...
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Terminal conditions (pins not designated may be high Cases 1 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no. Serial 3009 35 0.4 V IL2 0 ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no. Serial A 7 Truth 3014 table ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no. Serial 3003 101 to 105 MAX See F,J (Fig ...
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I limits (mA) min/max values for circuits shown: L Parameter Terminal Serial A, -.16/-.4 -.11/-.35 -.16/-.4 IL2 Mode " -.06/-.6 -.30/-.75 IL4 CLK " -.03/-.3 -.20/-.44 2, CLK ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E Subgroup Symbol 883 Cases 2 method Test no. CLK 3006 1 2 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E Subgroup Symbol 883 Cases method Test no. CLK 3009 43 4.5 V 4.5 V IL3 44 " " Tc ...
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MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLK Same tests, terminal conditions, and limits as subgroup 7, except (Fig MAX T ...
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MIL-STD- Cases E Subgroup Symbol 883 Cases method Test no. CLK (Fig. 7) 107 max See E t 3003 108 to 112 Same tests and terminal conditions ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases 1 2 883 A,B,C,D Subgroup Symbol method Cases 2 Test no 3006 1 2 " " Tc ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no 3011 33 9/ 4 ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no Same tests, terminal conditions, and limits as subgroup 7 except T ...
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FOOTNOTES: A. Apply input pulse 2 0 Test numbers 42 through 81 shall be run in sequence. E. Output voltages shall be either: (1) H 2.5 V minimum and ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases 1 2 883 A,B,C,D method Subgroup Symbol Cases 2 Test no. Serial 3006 ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no. Serial 3009 43 0.4 V IL1 0.4 ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no. Serial Truth 3014 table 58 " ...
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Terminal conditions (pins not designated may be high Cases 1 2 MIL-STD- A,B,C,D Subgroup Symbol 883 Cases method Test no. Serial (Fig GND ...
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FOOTNOTES: A. Apply input pulse: 2.5 V minimum/5.5 V maximum 2 0 Test numbers 57 through 79 shall be run in sequence. E. Output voltages shall be ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. CLR Serial 1 V 3006 1 2 " " ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. CLR Serial 3009 46 0.4 V IL1 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLK Serial 7 Truth 3014 table 69 " ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. CLK Serial 9 t 3003 109 IN PHL2 (Fig. 10) 110 ...
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FOOTNOTES: 2.5 V minimum/5.5 V maximum A. Apply input pulse Apply input pulse: 2.5 V minimum/5.5 V maximum 2.4V 0 Test numbers 62 through 87 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. Shift CLK E Load 1 V 3006 1 0 3006 2 " Tc ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E Subgroup Symbol 883 Cases method Test no. Shift CLK Load 1 I 3009 27 IL1 0.4 V ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. Shift CLK Load 7 2/ Truth 3014 table ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases Subgroup Symbol 883 Cases method Test no. Shift CLK Load MAX T = 125 3003 92 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E Subgroup Symbol 883 Cases 2 method Test no. Ser 3006 3007 ...
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Terminal conditions (pins not designated may be high MIL-STD- Cases E 883 Subgroup Symbol Cases 2 method Test no. Ser 3010 42 5.5 V IH2 43 5 ...
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MIL-STD- Cases E Subgroup Symbol 883 Cases 2 method Test no. Ser 3003 76 MAX See 77 PHL5 fig PLH1 t 79 PHL1 ...
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PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel performed by DoD personnel, these personnel need to contact the ...
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Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ........................................... Ground zero voltage potential I ................................................ Current flowing into an input terminal IN V ............................................... Input clamp voltage ...
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Military device Texas Signetics type Instruments 01, circuit-- A 02, circuit-- A 03, circuit-- A 04, circuit-- A 05, circuit-- A 06, circuit-- A 07, circuit-- A 08, circuit-- A 09, circuit-- A 6.6 Change from previous issue. Asterisks are ...