GD82551ER S L66X Intel, GD82551ER S L66X Datasheet - Page 79

• Manufacturer Part Number: GD82551ER S L66X
• Manufacturer: Intel

Specifications of GD82551ER S L66X

• Operating Supply Voltage (typ): 3.3V
• Operating Supply Voltage (min): 3V
• Operating Supply Voltage (max): 3.6V
• Operating Temperature Classification: Industrial
• Package Type: BGA
• Mounting: Surface Mount
• Pin Count: 196
• Lead Free Status / Rohs Status: Not Compliant

10.0
10.1
10.2
10.2.1
Datasheet
82551ER Test Port Functionality
Introduction
The 82551ER’s XOR Tree Test Access Port (TAP) is the access point for test data to and from the
device. The port provides the ability to perform basic production level testing.
Test Function Description
The 82551ER TAP mode supports two tests that can be used in board level design. These tests help
verify basic functionality as well as test the integrity of solder connection on the board. The tests
are described in the following subsections.
Tristate
The tristate command sets all 82551ER input and output pins into a tristate (high-Z) mode (all
internal pull-ups and pull-downs are disabled). This mode is entered by setting the following test
pin combination and resetting the device:
TEST = 1
TCK = 0
TEXEC = 0
TI = 1
Networking Silicon — 82551ER
71