AD22284-A Analog Devices Inc, AD22284-A Datasheet - Page 4
![no-image](/images/manufacturer_photos/0/0/57/analog_devices_inc_sml.jpg)
AD22284-A
Manufacturer Part Number
AD22284-A
Description
Manufacturer
Analog Devices Inc
Datasheet
1.AD22284-A.pdf
(12 pages)
Specifications of AD22284-A
Family Name
AD22284
Package Type
CLLCC
Operating Supply Voltage (min)
4.75V
Operating Supply Voltage (typ)
5V
Operating Supply Voltage (max)
5.25V
Operating Temperature (min)
-40C
Operating Temperature (max)
105C
Operating Temperature Classification
Industrial
Product Depth (mm)
5mm
Product Height (mm)
1.98mm
Product Length (mm)
5mm
Mounting
Surface Mount
Pin Count
8
Lead Free Status / Rohs Status
Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AD22284-A
Manufacturer:
BROADCOM
Quantity:
200
Company:
Part Number:
AD22284-A-R2
Manufacturer:
AD
Quantity:
201
ADXL278
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Acceleration (Any Axis, Unpowered)
Acceleration (Any Axis, Powered)
V
All Other Pins
Output Short-Circuit Duration
Operating Temperature Range
Storage Temperature
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
S
(Any Pin to Common)
Rating
4,000 g
4,000 g
−0.3 V to +7.0 V
(COM − 0.3 V) to
Indefinite
−65°C to +150°C
−65°C to +150°C
(V
S
+ 0.3 V)
Rev. A | Page 4 of 12
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.