AD5452YRM Analog Devices Inc, AD5452YRM Datasheet - Page 6

• Manufacturer Part Number: AD5452YRM
• Description: IC DAC 12BIT MULTIPLYING 8-MSOP
• Manufacturer: Analog Devices Inc

Specifications of AD5452YRM

• Design Resources: Unipolar, Precision DC Digital-to-Analog Conversion using AD5450/1/2/3 8-14-Bit DACs (CN0052) Precision, Bipolar, Configuration for AD5450/1/2/3 8-14bit Multiplying DACs (CN0053) AC Signal Processing Using AD5450/1/2/3 Current Output DACs (CN0054) Programmable Gain Element Using AD5450/1/2/3 Current Output DAC Family (CN0055) Single Supply Low Noise LED Current Source Driver Using a Current Output DAC in the Reverse Mode (CN0139)
• Settling Time: 160ns
• Number Of Bits: 12
• Data Interface: Serial
• Number Of Converters: 1
• Voltage Supply Source: Single Supply
• Power Dissipation (max): 55µW
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 8-MSOP, Micro8™, 8-uMAX, 8-uSOP,
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

AD5450/AD5451/AD5452/AD5453
ABSOLUTE MAXIMUM RATINGS
Transient currents of up to 100 mA do not cause SCR latch-up.
T
Table 3.
Parameter
V
V
I
Input Current to Any Pin Except Supplies
Logic Inputs and Output
Operating Temperature Range, Extended
Storage Temperature Range
Junction Temperature
θ
Lead Temperature, Soldering (10 sec)
IR Reflow, Peak Temperature (<20 sec)
1
OUT
Overvoltages at SCLK, SYNC , and SDIN are clamped by internal diodes.
JA
DD
REF
A
(Y Version)
8-Lead MSOP
8-Lead TSOT
= 25°C, unless otherwise noted.
Thermal Impedance
1 to GND
, R
to GND
FB
to GND
1
Rating
−0.3 V to +7 V
−12 V to +12 V
−0.3 V to +7 V
±10 mA
−0.3 V to V
−40°C to +125°C
−65°C to +150°C
150°C
206°C/W
211°C/W
300°C
235°C
DD
+ 0.3 V
Rev. E | Page 6 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION