X9318WS8 Intersil, X9318WS8 Datasheet - Page 4

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X9318WS8

Manufacturer Part Number
X9318WS8
Description
IC XDCP 100-TAP 10K 8-SOIC
Manufacturer
Intersil
Series
XDCP™r
Datasheet

Specifications of X9318WS8

Taps
100
Resistance (ohms)
10K
Number Of Circuits
1
Temperature Coefficient
300 ppm/°C Typical
Memory Type
Non-Volatile
Interface
Up/Down (3-Wire)
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Resistance In Ohms
10K
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

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D.C. OPERATING CHARACTERISTICS
(V
ENDURANCE AND DATA RETENTION
(V
Notes: (1) Absolute linearity is utilized to determine actual wiper voltage versus expected voltage = [V(R
A.C. CONDITIONS OF TEST
Test Circuit
Input pulse levels
Input rise and fall times
Input reference levels
Symbol
CC
CC
C
I
I
V
V
IN
CC
I
SB
LI
IH
= 5V ± 10%, T
IL
= 5V ± 10%, T
(5)
(2) Relative linearity is a measure of the error in step size between taps = [V(R
(3) 1 Ml = Minimum Increment = [V(R
(4) Typical values are for T
(5) This parameter is not 100% tested.
(6) Ratiometric temperature coefficient = (V(R
(7) Measured with wiper at tap position 31, R
V(R
from 0 to 99.
W(n)(expected)
V
Standby supply current
CS, INC, U/D input leakage current
CS, INC, U/D input HIGH voltage
CS, INC, U/D input LOW voltage
CS, INC, U/D input capacitance
CC
Minimum endurance
Data retention
R
active current (Increment)
Parameter
W
Test Point
A
A
= Full Operating Temperature Range unless otherwise stated)
= Full Operating Temperature Range)
Force
Current
Parameter
) = n(V(R
4
A
0.8V to 2.0V
10ns
1.4V
= 25°C and nominal supply voltage.
H
) - V(R
H
L
) - V(R
))/99 + V(R
Equivalent Circuit
R
L
L
W
H
)]/99.
grounded, using test circuit.
)
T1(n)
L
), with n from 0 to 99.
10pF
Min.
-10
-1
- V(R
2
C
H
W
X9318
100,000
R
)
Typ.
T2(n)
TOTAL
Min.
Limits
300
100
R
1
W
)/[V(R
(4)
25pF
C
W
W
V
Max.
CC
)
1000
T1(n)
+10
0.8
10
10pF
3
W(n+1)
C
+ 1
L
(T1 - T2) x 10
R
L
) - (V(R
Unit
mA
µA
µA
pF
V
V
W(n)
6
], with T1 & T2 being 2 temperatures, and n
CS = V
INC = 0.4V/2.4V @ min. t
R
CS ≥ 2.4V, U/D and INC = 0.4V
R
V
V
f = 1MHz
Data changes per bit
W(n)(actual)
) - MI)]/MI
IN
CC
L
L
, R
, R
= V
= 5V, V
H
H
, R
, R
IL
SS
Years
Test Conditions
Unit
, U/D = V
) - V(R
W
W
to V
IN
not connected
not connected
CC
= V
W(n)(expected)
IL
SS
or V
, T
September 14, 2005
A
IH
CYC
= 25°C,
)]/MI
and
FN8184.1

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