AD5161BRMZ5 Analog Devices Inc, AD5161BRMZ5 Datasheet - Page 12

IC POT DGTL 5K 256POS 10-MSOP

AD5161BRMZ5

Manufacturer Part Number
AD5161BRMZ5
Description
IC POT DGTL 5K 256POS 10-MSOP
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5161BRMZ5

Temperature Coefficient
45 ppm/°C Typical
Taps
256
Resistance (ohms)
50K
Number Of Circuits
1
Memory Type
Volatile
Interface
I²C, SPI
Voltage - Supply
2.7 V ~ 5.5 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
10-MSOP, Micro10™, 10-uMAX, 10-uSOP
Resistance In Ohms
50K
End To End Resistance
5kohm
No. Of Steps
256
Resistance Tolerance
± 30%
Supply Voltage Range
2.7V To 5.5V
Control Interface
Serial, I2C
No. Of Pots
Single
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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AD5161
TEST CIRCUITS
Figure 28 to Figure 36 illustrate the test circuits that define the test conditions used in the product specification tables.
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
V
V+
MS2
OFFSET
GND
Figure 30. Test Circuit for Wiper Resistance
V
DD
Figure 32. Test Circuit for Inverting Gain
V+
NO CONNECT
(Rheostat Operation; R-INL, R-DNL)
V
A
A
B
A
B
V
DUT
IN
W
W
A
B
DUT
A
A
DUT
B
W
OFFSET
BIAS
W
DUT
V
W
V
W
B
MS1
V
MS
PSRR (dB) = 20 LOG
PSS (%/%) =
V+ = V
I
W
OP279
= V
1LSB = V+/2
V+ = V
V
R
5V
V
MS
DD
DD
W
MS
= [V
/ R
DD
I
10%
W
NOMINAL
MS1
ΔV
ΔV
N
MS
DD
– V
V
%
%
OUT
MS2
(
ΔV
ΔV
]/I
MS
DD
W
)
Rev. A | Page 12 of 20
Figure 36. Test Circuit for Common-Mode Leakage current
OFFSET
Figure 35. Test Circuit for Incremental ON Resistance
GND
OFFSET
Figure 33. Test Circuit for Noninverting Gain
Figure 34. Test Circuit for Gain vs. Frequency
V
GND
V
V
DD
SS
IN
2.5V
DUT
GND
DUT
B
V
W
IN
DUT
OFFSET
BIAS
NC
A
NC
A
B
I
B
A
SW
DUT
W
NC = NO CONNECT
V
SS
CODE = 0x00
W
R
SW
W
TO V
B
=
OP279
0.1V
DD
I
I
SW
5V
CM
AD8610
–15V
+15V
0.1V
V
V
OUT
CM
V
OUT

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