AD7887BRZ Analog Devices Inc, AD7887BRZ Datasheet - Page 6

IC ADC 12BIT 2CHAN SRL 8SOIC

AD7887BRZ

Manufacturer Part Number
AD7887BRZ
Description
IC ADC 12BIT 2CHAN SRL 8SOIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD7887BRZ

Data Interface
DSP, MICROWIRE™, QSPI™, Serial, SPI™
Design Resources
Software Calibrated, 1 MHz to 8 GHz, 70 dB RF Power Measurement System Using AD8318 (CN0150)
Number Of Bits
12
Sampling Rate (per Second)
125k
Number Of Converters
1
Power Dissipation (max)
3.5mW
Voltage Supply Source
Single Supply
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
8-SOIC (0.154", 3.90mm Width)
Resolution (bits)
12bit
Sampling Rate
125kSPS
Input Channel Type
Single Ended
Supply Voltage Range - Analog
2.7V To 5.25V
Supply Current
850µA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
AD7887
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
Analog Input Voltage to AGND
Digital Input Voltage to AGND
Digital Output Voltage to AGND
REF
Input Current to Any Pin Except Supplies
Operating Temperature Range
Junction Temperature
SOIC or MSOP Package Power Dissipation
Pb-Free Temperature, Soldering Reflow
ESD
1
Transient currents of up to 100 mA do not cause SCR latch-up.
DD
A
Commercial Temperature Range
Storage Temperature Range
θ
θ
Lead Temperature, Soldering
= 25°C, unless otherwise noted.
IN
to AGND
JA
JC
A, B Versions
Vapor Phase (60 sec)
Infrared (15 sec)
/REF
Thermal Impedance
Thermal Impedance
OUT
to AGND
1
Rating
−0.3 V to +7 V
−0.3 V to V
−0.3 V to V
−0.3 V to V
−0.3 V to V
±10 mA
−40°C to +125°C
−65°C to +150°C
+150°C
450 mW
157°C/W (SOIC)
205.9°C/W (MSOP)
56°C/W (SOIC)
43.74°C/W (MSOP)
215°C
220°C
260(0)°C
4 kV
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. D | Page 6 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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