AD7476AAKSZ-500RL7 Analog Devices Inc, AD7476AAKSZ-500RL7 Datasheet - Page 10

• Manufacturer Part Number: AD7476AAKSZ-500RL7
• Description: IC ADC 12BIT 1MSPS LP SC70-6
• Manufacturer: Analog Devices Inc

Specifications of AD7476AAKSZ-500RL7

• Resolution (bits): 12bit
• Sampling Rate: 1MSPS
• Input Channel Type: Single Ended
• Data Interface: Serial, SPI
• Supply Current: 3.5mA
• Digital Ic Case Style: SC-70
• No. Of Pins: 6
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD7476A/AD7477A/AD7478A
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
V
Analog Input Voltage to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
Input Current to Any Pin Except Supplies
Operating Temperature Range
Junction Temperature
MSOP Package
SC70 Package
Lead Temperature, Soldering
Pb-Free Temperature Soldering
ESD
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Transient currents of up to 100 mA do not cause SCR latch-up.
DD
A
Commercial (A and B Grades)
Industrial (Y Grade)
Storage Temperature Range
θ
θ
θ
θ
Reflow (10 sec to 30 sec)
Reflow
= 25°C, unless otherwise noted.
to GND
JA
JC
JA
JC
Thermal Impedance
Thermal Impedance
Thermal Impedance
Thermal Impedance
1
Ratings
–0.3 V to +7 V
–0.3 V to V
–0.3 V to +7 V
–0.3 V to V
10 mA
–40°C to +85°C
–40°C to +125°C
–65°C to +150°C
150°C
205.9°C/W
43.74°C/W
340.2°C/W
228.9°C/W
235 (0/+5)°C
255 (0/+5)°C
3.5 kV
DD
DD
+ 0.3 V
+ 0.3 V
Rev. F | Page 10 of 28
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.