AD7767BRUZ Analog Devices Inc, AD7767BRUZ Datasheet - Page 8

• Manufacturer Part Number: AD7767BRUZ
• Description: ADC 24BIT 128KSPS SAR 16-TSSOP
• Manufacturer: Analog Devices Inc

Specifications of AD7767BRUZ

• Data Interface: Serial
• Number Of Bits: 24
• Sampling Rate (per Second): 128k
• Number Of Converters: 1
• Power Dissipation (max): 18mW
• Voltage Supply Source: Analog and Digital
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 16-TSSOP (0.173", 4.40mm Width)
• Resolution (bits): 24bit
• Sampling Rate: 128kSPS
• Input Channel Type: Differential, Single Ended
• Supply Voltage Range - Analog: 2.375V To 2.625V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: EVAL-AD7767EDZ - BOARD EVAL AD7767 128KSPS 108DBEVAL-AD7767-1EDZ - BOARD EVAL AD7767-1 64KSPS 111DB
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

AD7767
ABSOLUTE MAXIMUM RATINGS
T
Table 4.
Parameter
AV
DV
AV
V
REFGND to AGND
V
V
Digital Inputs to DGND
Digital Outputs to DGND
AGND to DGND
Input Current to Any Pin Except
Operating Temperature Range
Storage Temperature Range
Junction Temperature
TSSOP Package
Lead Temperature, Soldering
ESD
1
Transient currents of up to 100 mA do not cause SCR latch-up.
REF+
DRIVE
IN+
A
Supplies
θ
θ
Vapor Phase (60 sec)
Infrared (15 sec)
DD
DD
DD
= 25°C, unless otherwise noted.
, V
JA
JC
to REFGND
to AGND
to DV
to DGND
to DGND
IN–
Thermal Impedance
Thermal Impedance
to AGND
DD
1
Rating
−0.3 V to +3 V
−0.3 V to +3 V
−0.3 V to +0.3 V
−0.3 V to +7 V
−0.3 V to +0.3 V
−0.3 V to +6 V
−0.3 V to V
−0.3 V to V
−0.3 V to V
−0.3 V to +0.3 V
±10 mA
−40°C to +105°C
−65°C to +150°C
150°C
150.4°C/W
27.6°C/W
215°C
220°C
1 kV
REF+
DRIVE
DRIVE
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. C | Page 8 of 24
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION