ISL12022MIBZ-T Intersil, ISL12022MIBZ-T Datasheet - Page 7
![no-image](/images/manufacturer_photos/0/3/341/intersil_sml.jpg)
ISL12022MIBZ-T
Manufacturer Part Number
ISL12022MIBZ-T
Description
IC RTC/CALENDAR TEMP SENS 20SOIC
Manufacturer
Intersil
Type
Clock/Calendarr
Datasheet
1.ISL12022MIBZ-T.pdf
(31 pages)
Specifications of ISL12022MIBZ-T
Memory Size
128B
Time Format
HH:MM:SS (12/24 hr)
Date Format
YY-MM-DD-dd
Interface
I²C, 2-Wire Serial
Voltage - Supply
2.7 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
20-SOIC (7.5mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
ISL12022MIBZ-TCT
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ISL12022MIBZ-T
Manufacturer:
INTERSIL
Quantity:
20 000
Part Number:
ISL12022MIBZ-TR5421
Manufacturer:
INTERSIL
Quantity:
20 000
I
NOTES:
10. IRQ/F
11. V
12. In order to ensure proper timekeeping, the V
13. Limits should be considered typical and are not production tested.
14. These are I
15. Minimum V
2
7. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits
8. Specified at +25°C.
9. Temperature Conversion is inactive below V
C Interface Specifications
SYMBOL
t
t
t
t
t
established by characterization and are not production tested.
specification.
HD:STA
HD:DAT
SU:STO
HD:STO
SU:DAT
DD
t
R
Cb
t
DH
t
PU
R
F
> V
OUT
BAT
inactive.
2
DD
C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate
START Condition Hold Time
Input Data Setup Time
Input Data Hold Time
STOP Condition Setup Time
STOP Condition Hold Time
Output Data Hold Time
SDA and SCL Rise Time
SDA and SCL Fall Time
Capacitive Loading of SDA or
SCL
SDA and SCL Bus Pull-up
Resistor Off-chip
+V
and/or V
BATHYS
PARAMETER
BAT
7
of 1V to sustain the SRAM. The value is based on characterization and it is not tested.
Test Conditions: V
unless otherwise specified. Boldface limits apply over the operating temperature
range, -40°C to +85°C. (Continued)
From SDA falling edge
crossing 30% of V
SCL falling edge crossing
70% of V
From SDA exiting the
30% to 70% of V
window, to SCL rising
edge crossing 30% of
V
From SCL falling edge
crossing 30% of V
SDA entering the 30% to
70% of V
From SCL rising edge
crossing 70% of V
SDA rising edge crossing
30% of V
From SDA rising edge to
SCL falling edge. Both
crossing 70% of V
From SCL falling edge
crossing 30% of V
until SDA enters the
30% to 70% of V
window.
From 30% to 70% of
V
From 70% to 30% of
V
Total on-chip and
off-chip
Maximum is determined
by t
For Cb = 400pF, max is
about 2kΩ~2.5kΩ.
For Cb = 40pF, max is
about 15kΩ~20kΩ
BAT
DD.
DD.
DD.
TEST CONDITIONS
DD SR-
R
= 2.7V. Device operation is not guaranteed at V
and t
ISL12022M
DD
DD
DD
specification must be followed.
DD
F
.
.
.
window.
= +2.7 to +5.5V, Temperature = -40°C to +85°C,
DD
DD
DD
DD
DD
DD
DD
, to
.
,
to
to
20 + 0.1 x
20 + 0.1 x
(Note 7)
MIN
600
100
600
600
20
Cb
Cb
10
0
1
(Note 8)
TYP
(Note 7) UNITS
BAT
MAX
900
300
300
400
<1.8V.
kΩ
ns
ns
ns
ns
ns
ns
ns
ns
pF
June 4, 2010
NOTES
13, 14
13, 14
13, 14
13, 14
FN6668.7