5962-8959841MZA QP SEMICONDUCTOR, 5962-8959841MZA Datasheet - Page 4

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5962-8959841MZA

Manufacturer Part Number
5962-8959841MZA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-8959841MZA

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DSCC FORM 2234
APR 97
1.3 Absolute maximum ratings - continued. 3/ 4/
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited
in the solicitation or contract.
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
Unless otherwise specified, the issues of the documents are the issues of the documents cited in the solicitation.
(Applications for copies of ASTM publications should be addressed to:
Harbor Drive, West Conshohocken, PA 19428-2959; http://www.astm.org.)
the documents. These documents also may be available in or through libraries or other informational services.)
3/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
4/ All voltages referenced to V SS (V SS = ground) unless otherwise specified.
6/ When the θ JC for this case is specified in MIL-STD-1835, that value shall supersede the value indicated herein.
7/ Maximum junction temperature may be increased to +175°C during burn-in and steady-state life.
1.4 Recommended operating conditions.
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
(Copies of these documents are available online at
2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein.
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)
(Non-Government standards and other publications are normally available from the organizations that prepare or distribute
maximum levels may degrade performance and affect reliability.
DEPARTMENT OF DEFENSE SPECIFICATION
DEPARTMENT OF DEFENSE STANDARDS
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
MIL-STD-883
MIL-STD-1835 -
MIL-HDBK-103 -
MIL-HDBK-780 -
ASTM Standard F1192-95
Thermal resistance, junction-to-case (θ JC ):
Output voltage applied in high Z state..........................
Maximum power dissipation, (P D )................................
Maximum junction temperature (T J ) ............................
Supply voltage range (V CC ) ........................................
Supply voltage range (V SS ).........................................
High level input voltage range (V IH ).............................
Low level input voltage range (V IL ) ..............................
Case operating temperature range (T C ) ......................
DEFENSE SUPPLY CENTER COLUMBUS
Case M ......................................................................
Cases X, Y, Z, U, and 7 .............................................
Cases T, N, and 9 ......................................................
Case 8 .......................................................................
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
-
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
-
Standard Guide for the Measurement of Single Event Phenomena from
Heavy Ion Irradiation of Semiconductor Devices.
http://assist.daps.dla.mil/quicksearch/
See MIL-STD-1835
11°C/W 6/
10°C/W 6/
-0.5 V dc to V CC +0.5 V dc
1.0 W
+150°C 7/
4.5 V dc minimum to 5.5 V dc maximum
0.0 V dc
2.2 V dc to V CC + 0.5 V dc
-0.5 V dc to 0.8 V dc
-55°C to +125°C
16°C/W 6/
SIZE
ASTM International, PO Box C700, 100 Barr
A
REVISION LEVEL
or
R
http://assist.daps.dla.mil
SHEET
5962-89598
or
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