M38510/20703BEA E2V, M38510/20703BEA Datasheet - Page 17
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M38510/20703BEA
Manufacturer Part Number
M38510/20703BEA
Description
Manufacturer
E2V
Datasheet
1.M3851020703BEA.pdf
(36 pages)
Specifications of M38510/20703BEA
Lead Free Status / RoHS Status
Supplier Unconfirmed
follows:
point electrical parameters shall be as specified in table II herein.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall
c. For qualification inspection, at least 50 percent of the sample selected for testing in subgroup 1 shall
be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-
in test circuit shall be maintained under document control by the device manufacturer's Technology
Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring
or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and
power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-
STD-883.
be programmed (see 3.3.2). For quality conformance inspection, the programmability sample (see
4.4.1c) shall be included in the life tests.
1/ * indicates PDA applies to subgroups 1 and 7 (see 4.2c).
2/ Any or all subgroups may be combined when using high-speed testers.
3/ Subgroups 7 and 8 shall consist of verifying the pattern specified.
Interim electrical parameters
Final electrical test parameters
Final electrical test parameters
Group A test requirements
Group B end-point electrical parameters
Group C end-point electrical
Group D test requirements
for unprogrammed devices
for programmed devices
parameters
when using the method 5005 QCI option
test requirements
MIL-PRF-38535
TABLE II. Electrical test requirements.
MIL-M-38510/207E
17
1*, 2, 3, 7*
8, 9, 10, 11
1*, 2, 3, 7*,
8
1, 2, 3, 7, 8,
9, 10, 11
1, 2, 3, 7, 8,
1, 2, 3, 7, 8,
1, 2, 3, 7, 8
9, 10, 11
9, 10, 11
Class S
devices
Subgroups (see table III)
1
1/, 2/, 3/
1*, 2, 3, 7*,
8, 9,
1, 2, 3, 7, 8
1, 2, 3, 7, 8
1*, 2, 3,
7*, 8
1, 2, 3, 7, 8
9, 10, 11
Class B
devices
N/A
1