M38510/01205BEA E2V, M38510/01205BEA Datasheet

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M38510/01205BEA

Manufacturer Part Number
M38510/01205BEA
Description
Manufacturer
E2V
Datasheet

Specifications of M38510/01205BEA

Lead Free Status / RoHS Status
Supplier Unconfirmed
multivibrators microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are
provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have
been superseded by MIL-PRF-38535, (see 6.3).
______
1/ For device type 06, the t
2/ Inactive package case outline. Acceptable only for use in equipment designed or redesigned on or before
AMSC N/A
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43218-3990, or email
bipolar@dscc.dla.mil
address information using the ASSIST Online database at
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, bipolar, TTL, monostable
1.2 Part or Identifying number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outline. The case outlines are as designated in MIL-STD-1835 and as follows:
29 November 1986.
The requirement for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, MONOSTABLE MULTIVIBRATORS, MONOLITHIC SILICON
This specification is approved for use by all Departments and Agencies of the Department of Defense.
Device type
Outline letter
01
02
03
04
05
06
A 2/
B 2/
C
D
E
F
. Since contact information can change, you may want to verify the currency of this
P(OUT)1
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
GDFP5-F14 or CDFP6-F14
GDFP4-14
Descriptive designator
Inactive for new design as of September 07, 1995.
maximum test limit under TABLE I and TABLE III is 168 ns at -55°C, 125°C.
Single monostable multivibrator, with Schmitt trigger input
Single retriggerable monostable multivibrator with clear
Dual retriggerable monostable multivibrator with clear
One shot multivibrator
Dual one shot multivibrator
Single monostable multivibrator, with Schmitt trigger input 1/
MILITARY SPECIFICATION
Circuit
http://assist.daps.dla.mil
Terminals
14
16
14
14
14
16
Dual-in-line
Dual in line
Package style
Flat pack
Flat pack
Flat pack
Flat pack
.
MIL-M-38510/12J
22 February 2005
SUPERSEDING
MIL-M-38510/12H
16 December 2003
FSC 5962
INCH-POUND

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M38510/01205BEA Summary of contents

Page 1

MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, MONOSTABLE MULTIVIBRATORS, MONOLITHIC SILICON This specification is approved for use by all Departments and Agencies of the Department of Defense. Inactive for new design as of September 07, 1995. The requirement for acquiring the product herein ...

Page 2

Absolute maximum ratings. Supply voltage range ....................................................................... -0 +7 Input voltage range .......................................................................... - Storage temperature range .............................................................. -65°C to +150°C Maximum power dissipation (P ...

Page 3

APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections this specification. This section does not include documents cited in other sections of this specification or recommended for additional information ...

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Test Symbol High-level output V OH voltage Low-level output V OL voltage Input clamp voltage V IC Low-level input I IL1 current Low-level input I IL2 current at B Low level input I IL1 current at ...

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TABLE I. Electrical performance characteristics – continued. Test Symbol Short circuit output I OS current Supply current I CC1 (quiescent) Supply current I CC2 (triggered) Propagation delay time t PLH1 to high level (B input to Q output) Propagation delay ...

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TABLE I. Electrical performance characteristics – continued. Test Symbol Pulse width obtained t P(OUT)2 with internal timing resistor Pulse width obtained t P(OUT)3 with external timing resistor t P(OUT)4 Propagation delay time t PLH1 to high level ( ...

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TABLE I. Electrical performance characteristics – continued. Test Symbol Minimum pulse t W(MIN) width of Q output pulse Width of Q output t W pulse Propagation delay t PLH1 time to high level ( inputs ...

Page 8

TABLE I. Electrical performance characteristics – continued. Test Symbol Minimum pulse t W(MIN) width of Q output pulse Width of Q output t W pulse Propagation delay t PLH1 time to high level (A input to Q output) Propagation delay ...

Page 9

TABLE I. Electrical performance characteristics – continued. Test Symbol Minimum pulse t W(MIN) width of Q output pulse Width of Q output t W pulse 1/ Ground C to measure ...

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MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group B electrical test parameters when using the method 5005 QCI option Group C end-point electrical parameters Group D end-point electrical parameters *PDA applies to subgroup ...

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NOTES (Device types 01 and 06): 1. The use internal timing resistor (2 kΩ nominal) connect pin obtain a variable pulse width, connect external variable resistor between pins external current limiting is required. ...

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NOTE (device types 04 and 05): An external timing capacitor (C ) and an external timing resistor ( determine output pulse duration and accuracy. ext ext Figure 1. Logic diagrams and terminal connections (top views) ...

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DEVICE TYPES 01 and 06 INPUTS OUTPUTS ↓ ↓ ↑ ⎡⎤ ↑ ⎡⎤ H ↓ H ⎡⎤ ↓ ⎡⎤ ↓ ...

Page 14

DEVICE TYPE 04 INPUTS ↑ ↑ ↓ ...

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Description of device types 01, 02, and 06 These monostables are designed to provide the system designer with complete flexibility in controlling the pulse width, either to lengthen the pulse by retriggering shorten by clearing. Device types 01, ...

Page 16

Description of device types 01 and 06 –Continued. NOTE: See 1.4 for maximum external timing resistance values. FIGURE 3. Device descriptions – Continued. 16 ...

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B. Description of device types 01 and 06 –Continued. FIGURE 3. Device descriptions – Continued. 17 ...

Page 18

These values of resistance exceed the maximums recommended for use over the full temperature range. FIGURE 3. Device descriptions – Continued. Description of device types 02 and 03 18 ...

Page 19

Description of device types 02 and 03 To prevent reverse voltage across C electrolytic capacitors and in applications utilizing the clear functions. This circuit is also recommended for C In all applications using the diode, the pulse width is: t ...

Page 20

Description of device types 02 and 03 These monolithic TTL retriggerable monostable multivibrators feature d-c triggering from gated low-level-active (A) and high-level-active (B) inputs, and also provide overriding direct clear inputs. Complementary outputs are provided. The retrigger capability simplies the ...

Page 21

Description of device type 04 These retriggerable monostables multivibrator provides an output pulse whose duration and accuracy is a function of external timing components designed to allow a choice of triggering either the leading or trailing edge of ...

Page 22

Description of device type 04 - Continued Circuit C. This circuit is used to obtain extended pulse width. This configuration obtains extended pulse widths, because of the larger timing resistor allowed by Beta multiplication. Electrolytics with high ( > 5 ...

Page 23

Description of device type 04 FIGURE 3. Device descriptions – Continued. 23 ...

Page 24

Description of device types 04 and 05 These monolithic TTL retriggerable monostable multivibrators feature d-c triggering from gated low-level-active (A) and high-level-active (B) inputs, and also provide overriding direct clear inputs. Complementary outputs are provided. The retrigger capability simplies the ...

Page 25

Description of device type 05 This dual retriggerable, resettlable monostables multivibrator provides an output pulse whose duration and accuracy is a function of external timing components designed to allow a choice of triggering either the leading or trailing ...

Page 26

Description of device type 05 - Continued Circuit C. This circuit is used to obtain extended pulse widths. This configuration obtains extended pulse widths, because of the larger timing resistor allowed by Beta multiplication. Electrolytics with high inverse leakage currents ...

Page 27

Description of device type 05 OUTPUT PULSE WIDTH VERSUS TIMING RESISTANCE AND CAPACITANCE FIGURE 3. Device descriptions – Continued. 27 ...

Page 28

NOTES: 1. The pulse generator has the following characteristics ns, PRR ≤ 1 MHz, and Z t SETUP 2. All diodes are 1N3064 or equivalent minimum including probe and jig capacitance. L ...

Page 29

NOTES: 1. The pulse generator has the following characteristics: V ≈ 50 Ω, and PRR is as follows ns, Z SETUP OUT = 390 Ω ± 5.0 V minimum ...

Page 30

NOTES: 1. Unless otherwise specified in the notes with individual waveforms, all pulse generators shall have the following characteristics: t TLH minimum including probe and jig capacitance All diodes are 1N3064 or equivalent. ...

Page 31

A1 INPUT to Q and Q OUTPUTS (t NOTES: input characteristics: PRR ≤ 1 MHz and clear = 5 INPUT to Q and Q ...

Page 32

CLEAR to Q and Q OUTPUTS (t NOTES: input characteristics: PRR ≤ 1 MHz Clear input characteristics: PRR ≤ 1 MHz 5 FIGURE ...

Page 33

NOTES: 1. Unless otherwise specified in the notes with individual waveforms, all pulse generators shall have the following characteristics: t TLH minimum including probe and jig capacitance All diodes are 1N3064 or equivalent. ...

Page 34

A INPUT to Q and Q OUTPUTS (t NOTES: A input characteristics: PRR ≤ 1 MHz and clear = 5 INPUT to Q and Q OUTPUTS (t NOTES: B input characteristics: PRR ≤ 285 ...

Page 35

CLEAR to Q and Q OUTPUTS (t NOTES: input characteristics: PRR ≤ 285 kHz Clear input characteristics: PRR ≤ 285 kHz 5.0 V. FIGURE 7. Switching test circuit and waveforms for ...

Page 36

NOTES: 1. Unless otherwise specified in the notes with individual waveforms, all pulse generators shall have the following characteristics: t TLH minimum including probe and jig capacitance All diodes are 1N3064 or equivalent. ...

Page 37

A1 INPUT to Q and Q OUTPUTS (t NOTES: input characteristics: PRR ≤ 1 MHz and and t (min ...

Page 38

NOTES: 1. Unless otherwise specified in the notes with individual waveforms, all pulse generators shall have the following characteristics: t TLH minimum including probe and jig capacitance All diodes are 1N3064 or equivalent. ...

Page 39

A INPUT to Q and Q OUTPUTS (t NOTES: A input characteristics: PRR ≤ 1 MHz GND, and clear = 5 and t (min INPUT to Q and Q ...

Page 40

CLEAR to Q and Q OUTPUTS (t NOTES: A input characteristics: PRR ≤ 1 MHz Clear input characteristics: PRR ≤ 1 MHz GND FIGURE 9. Switching test circuit and waveforms for device type ...

Page 41

Terminal conditions (pins not designated may be high ≥ 2.4 V, low ≤ 0 open) Subgroup Symbol MIL- Cases 1 2 STD-883 A,B,C,D method Test no 3007 3007 ...

Page 42

Terminal conditions (pins not designated may be high ≥ 2.4 V, low ≤ 0 open) Subgroup Symbol MIL- Cases 1 2 A,B,C,D STD-883 method Test no 3003 38 t PLH1 Tc = +25 ° C ...

Page 43

Terminal conditions (pins not designated may be high ≥ 2.4 V, low ≤ 0 open) Subgroup Symbol MIL- Cases 1 2 STD-883 A,B,C,D method Test no 3007 =+25 ° ...

Page 44

Terminal conditions (pins not designated may be high ≥ 2.4 V, low ≤ 0 open) Subgroup Symbol MIL- Cases 1 2 A,B,C,D STD-883 method Test no 3003 PLH1 ...

Page 45

Subgroup Symbol MIL-STD- Case 1 2 883 E, F method Test no. Clear 3007 1 2 “ 2 0 “ 3 +25 ° ...

Page 46

Subgroup Symbol MIL-STD- Case 1 2 883 E, F method Test no. Clear +125 ° C and T = -55 ° C. Repeat subgroup 3003 44 ...

Page 47

Subgroup Symbol MIL-STD- Case 1 2 883 E, F method Test no. Clear 3003 74 IN 5.0 V W(MIN) 13/ (Fig “ 75 W(MIN) 13/ +125 ° ...

Page 48

Terminal conditions (pins not designated may be high ≥ 2.4 V, low ≤ 0 open) Subgroup Symbol MIL- Cases 1 2 STD-883 A,B,C,D method Test no 3007 =+25 ° ...

Page 49

Terminal conditions (pins not designated may be high ≥ 2.4 V, low ≤ 0 open) Subgroup Symbol MIL- Cases 1 2 STD-883 A,B,C,D method Test no 3003 W(MIN) ...

Page 50

Subgroup Symbol MIL-STD- Case 883 E, F method Test no Clear 3007 1 0 “ 2 0 “ ...

Page 51

Subgroup Symbol MIL-STD- Case 1 2 883 E, F method Test no Clear +125 ° C and T = -55 ° C. Repeat subgroup ...

Page 52

Subgroup Symbol MIL-STD- Case 1 2 883 E, F method Test no Clear 3003 74 2/ W(MIN) 8/ (Fig “ 75 W(MIN) 8/ +125 ° ...

Page 53

Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF- 38535 and herein for groups and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance ...

Page 54

NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing ...

Page 55

Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or ...

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