5962-8684702EA QP SEMICONDUCTOR, 5962-8684702EA Datasheet - Page 8

• Manufacturer Part Number: 5962-8684702EA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8684702EA

• Logic Family: HC
• High Level Output Current: -5.2mA
• Low Level Output Current: 5.2mA
• Number Of Elements: 2
• Operating Temperature Classification: Military
• Operating Supply Voltage (max): 6V
• Operating Supply Voltage (typ): 2.5/3.3/5V
• Operating Temperature (max): 125C
• Technology: CMOS
• Abs. Propagation Delay Time: 250ns
• Operating Supply Voltage (min): 2V
• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
1/
2/
3/
4/
5/
6/
Output pulse width
Output rise and fall
Maximum input
(standby)
time
capacitance
For a power supply of 5.0 V ±10% the worst-case output voltage (V
values should be used when designing with this supply. Worst case V
respectively. (The V
the higher voltage so the 6.0 V values should be used.
Testing at V
V
Limit current to I
Guaranteed, if not tested, to the limits specified in table I.
When testing I
resistance path from V
IH
DEFENSE SUPPLY CENTER COLUMBUS
and V
Test
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
IL
tests are not required if applied as forcing functions for the V
CC
IL
= 2.0 V and V
, the Q output must be high, if Q is low (device not triggered) the pull-up P device will be on and the low
OL
STANDARD
or use a suitable series resistor ≥ 500Ω; perform test while Q is high.
Symbol
IH
2/, 5/
t
t
t
C
THL,
TLH
DD
WQ
5/
value at V
IN
to the test pin will cause a current far exceeding the specification.
TABLE I. Electrical performance characteristics - Continued.
CC
C
R
See figure 4
C
See figure 4
R/C
Other inputs, See 4.3.1c
L
EXT
L
= 6.0 V shall be guaranteed, if not tested, to the specified limit in table I.
= 50 pF minimum
= 50 pF minimum
CC
EXT
= 10 kΩ, C
= 5.5 V is 3.85 V.) The worst case leakage current (I
, See 4.3.1c
unless otherwise specified
-55°C ≤ T
Test conditions
EXT
= 0.1 μF
C
≤ +125°C 1/
V
V
V
V
V
CC
CC
CC
CC
CC
SIZE
A
= 5.0 V
= 4.5 V
= 2.0 V
= 4.5 V
= 6.0 V
OH
and V
IN
OH
and V
and V
OL
Device
REVISION LEVEL
) occur for HC at 4.5 V. Thus, the 4.5 V
IL
type
01
02
All
All
occur at V
OL
tests.
subgroups
Group A
IN
D
10, 11
10, 11
10, 11
10, 11
10, 11
CC
and I
9
9
9
9
9
4
= 5.5 V and 4.5 V,
CC
) occur for CMOS at
0.38
0.70
Min
0.9
0.4
SHEET
Limits
5962-86847
Max
0.52
1.15
110
0.5
1.2
75
15
22
13
19
20
10
8
Unit
ms
pF
ns