5962-8972301EA NXP Semiconductors, 5962-8972301EA Datasheet - Page 11

• Manufacturer Part Number: 5962-8972301EA
• Manufacturer: NXP Semiconductors
• Type: D-Typer

Specifications of 5962-8972301EA

• Logic Family: F
• Number Of Bits: 8
• Number Of Elements: 1
• Latch Mode: Addressable
• Polarity: Non-Inverting
• Technology: Bipolar
• Package Type: CDIP
• Propagation Delay Time: 14.5ns
• Operating Supply Voltage (typ): 5V
• High Level Output Current: -1mA
• Low Level Output Current: 20mA
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Operating Temp Range: -55C to 125C
• Operating Temperature Classification: Military
• Mounting: Through Hole
• Pin Count: 16
• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
a.
b.
c.
a.
b.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroups 7 and 8 shall include verification of the truth table.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
A
= +125°C, minimum.
STANDARD
* PDA applies to subgroup 1.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point
MIL-STD-883 test requirements
(method 5004)
(method 5004)
(method 5005)
electrical parameters
(method 5005)
TABLE II. Electrical test requirements.
1*, 2, 3, 7, 8, 9, 10, 11
1, 2, 3, 7, 8, 9, 10, 11
1, 2, 3
MIL-STD-883, method 5005,
SIZE
A
(in accordance with
Subgroups
table I)
- - -
REVISION LEVEL
A
SHEET
5962-89723
11