MC9S08SH4CTG Freescale, MC9S08SH4CTG Datasheet - Page 316
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MC9S08SH4CTG
Manufacturer Part Number
MC9S08SH4CTG
Description
Manufacturer
Freescale
Datasheet
1.MC9S08SH4CTG.pdf
(338 pages)
Specifications of MC9S08SH4CTG
Cpu Family
HCS08
Device Core Size
8b
Frequency (max)
40MHz
Interface Type
I2C/SCI/SPI
Total Internal Ram Size
256Byte
# I/os (max)
13
Number Of Timers - General Purpose
1
Operating Supply Voltage (typ)
3.3/5V
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
2.7V
On-chip Adc
8-chx10-bit
Instruction Set Architecture
CISC
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
16
Package Type
TSSOP
Program Memory Type
Flash
Program Memory Size
4KB
Lead Free Status / RoHS Status
Compliant
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1
Appendix A Electrical Characteristics
A.14 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.14.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
A.14.2
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
Table
316
Radiated emissions,
electric field
Data based on qualification test results.
A-18.
Parameter
Radiated Emissions
Conducted Transient Susceptibility
V
Symbol
Table A-17. Radiated Emissions, Electric Field
RE_TEM
MC9S08SH8 MCU Series Data Sheet, Rev. 3
package type
Conditions
T
16-TSSOP
V
A
DD
= +25
= 5 V
o
C
500 – 1000 MHz
150 – 500 MHz
0.15 – 50 MHz
50 – 150 MHz
Frequency
SAE Level
IEC Level
4 MHz crystal
16 MHzbus
f
OSC
/f
BUS
Freescale Semiconductor
Level
(Max)
–6
–9
N
0
0
1
1
dBμV
Unit
—
—
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