5962-9319005MPA Linear Technology, 5962-9319005MPA Datasheet - Page 12

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5962-9319005MPA

Manufacturer Part Number
5962-9319005MPA
Description
Manufacturer
Linear Technology
Datasheet

Specifications of 5962-9319005MPA

Number Of Pwm Outputs
1
On/off Pin
No
Adjustable Output
No
Synchronous Pin
No
Operating Temperature Classification
Military
Mounting
Through Hole
Pin Count
8
Package Type
CDIP
Lead Free Status / RoHS Status
Not Compliant
DSCC FORM 2234
APR 97
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.
(see 3.5 herein).
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
a.
b.
DEFENSE SUPPLY CENTER COLUMBUS
End-point electrical parameters shall be as specified in table II herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at T
after exposure, to the subgroups specified in table II herein.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
1/ PDA applies to subgroup 1.
Interim electrical
Final electrical
Group A test
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
parameters (see 4.2)
parameters (see 4.2)
requirements (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
Test requirements
STANDARD
TABLE II. Electrical test requirements.
method 5005, table I)
(in accordance with
1, 2, 3, 4, 5, 6, 10
1, 2, 3, 4, 5, 6, 10
MIL-STD-883,
Subgroups
class M
Device
1, 2, 3
1, 2, 3
- - -
----
1/
SIZE
A
1, 2, 3, 4, 5,
1, 2, 3, 4, 5,
6, 10
MIL-PRF-38535, table III)
class Q
Device
1, 2, 3
1, 2, 3
6, 10
- - -
----
(in accordance with
REVISION LEVEL
Subgroups
1/
1, 2, 3, 4, 5,
1, 2, 3, 4, 5,
6, 10
A
class V
Device
1, 2, 3
1, 2, 3
6, 10
- - -
----
1/
A
= +25°C ±5°C,
SHEET
5962-93190
12

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