5962-8765102LA E2V, 5962-8765102LA Datasheet - Page 9

• Manufacturer Part Number: 5962-8765102LA
• Manufacturer: E2V

Specifications of 5962-8765102LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
made available upon request.
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
e. Subgroups 7 and 8 shall include verification of the truth table.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
c. Group C, subgroup 1 sample shall include devices tested in accordance with 4.3.1d.
(1)
(2)
Group A, subgroups 9, 10, and 11. Either of the two techniques is acceptable:
(1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programmability
and ac performance without programming the user array. If this is done, the resulting test patterns shall be verified
on all devices during subgroups 9, 10, and 11, group A testing in accordance with the sampling plan specified in
MIL-STD-883, method 5005.
If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 3.2.2.2). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than 4 total device failures allowable. Ten
devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, and
11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be
increased to 20 total devices with no more than 4 total device failures allowable.
control and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-
STD-883.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
1/ * Indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ ** See 4.3.1c.
4/ As a minimum, subgroups 7 and 8 shall consist of verifying the data pattern.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point electrical
parameters (method 5005)
MIL-STD-883 test requirements
(method 5004)
(method 5004)
(method 5005)
TABLE II. Electrical test requirements. 1/ 2/ 3/ 4/
Subgroups (in accordance with
method 5005, table I)
1*, 2, 3, 7*, 8A, 8B, 9, 10, 11
1, 2, 3, 4**, 7, 8A, 8B, 9, 10, 11
2, 3, 7, 8A, 8B
SIZE
A
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REVISION LEVEL
C
SHEET
5962-87651
9