5962-9080304MLA QP SEMICONDUCTOR, 5962-9080304MLA Datasheet - Page 7

• Manufacturer Part Number: 5962-9080304MLA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9080304MLA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
1/
2/
3/
4/
5/
6/
Chip select active to
Chip select active to
Chip select inactive to
Chip select inactive
output valid
power-up 3/
power-down 3/
to high-Z 3/
These are absolute values with respect to device ground and all overshoots and undershoots due to system or tester noise
are included.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30
Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the
At f = f
AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of
0 to 3.0 V, and the output load in figure 4.
Transition is measured at steady state high level -500 mV or steady state low level +500 mV on the output from the 1.5 V
seconds.
limits specified in table I.
level on the input, C
DEFENSE SUPPLY CENTER COLUMBUS
Test
max
MICROCIRCUIT DRAWING
, address inputs are cycling at the maximum frequency of 1/t
COLUMBUS, OHIO 43218-3990
STANDARD
L
= 5 pF (including scope and jig). See figure 4.
t
t
t
t
Symbol
ACS
PU
PD
HZCS
TABLE I. Electrical performance characteristics – Continued.
See figures 3 and 4 and
note 5/
See figures 3 and 4 and
note 5/ and 6/
unless otherwise specified
-55°C ≤ T
4.5 V ≤ V
Conditions
C
CC
≤ +125°C
≤ 5.5 V
SIZE
A
AA
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
subgroups
.
Group A
REVISION LEVEL
Device
03, 05
04, 07
01-04
type
01
02
03
04
05
06
07
08
01
02
03
04
01
02
06
08
C
Min
0
Limits
SHEET
Max
55
45
40
25
35
30
20
15
55
45
35
25
55
45
35
25
30
15
5962-90803
7
Unit
ns
ns
ns
ns