5962-8953702YA QP SEMICONDUCTOR, 5962-8953702YA Datasheet - Page 6

• Manufacturer Part Number: 5962-8953702YA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8953702YA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
1/
2/
3/
4/
5/
6/
7/
Chip select active to
Chip select inactive to
Chip select inactive to
Chip select active to
DEFENSE SUPPLY CENTER COLUMBUS
power_up 4/ 6/ 7/
power_down 4/ 6/ 7/
high-Z 4/ 5/ 7/
high-Z 4/ 6/ 7/
AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of
0 V to 3.0 V, and the output load in figure 3, circuit A.
These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
second.
Tested initially and after any design or process change which may affect that parameter, and therefore shall be
guaranteed to the limits specified in table I.
Parameter applies only to CS
Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from 1.5 V
level on the input and the output load in figure 3, circuit B.
For test purposes, not more than one output at a time may be shorted. Short circuit test duration should not exceed one
Parameter applies to CS
COLUMBUS, OHIO 43218-3990
MICROCIRCUIT DRAWING
Test
STANDARD
Symbol
2
t
t
t
t
TABLE I. Electrical performance characteristics - Continued.
PU
PD
HZCS1
HZCS2
, CS
1
.
3
, and CS
See figure 4
V
CC
4.5 V dc ≤ V
unless otherwise specified
= 4.5 V
-55°C ≤ T
4
.
Conditions 1/
A
CC
≤ +125°C
≤ 5.5 V dc
SIZE
A
subgroups
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
Group A
REVISION LEVEL
Device
types
All
01
02
03
01
02
03
01
02
03
B
Min
0
Limits
SHEET
Max
70
60
50
35
30
25
70
60
50
5962-89537
6
Unit
ns
ns
ns
ns