MT36JSZF51272PY-1G1D1 Micron Technology Inc, MT36JSZF51272PY-1G1D1 Datasheet - Page 19

• Manufacturer Part Number: MT36JSZF51272PY-1G1D1
• Manufacturer: Micron Technology Inc

Specifications of MT36JSZF51272PY-1G1D1

• Main Category: DRAM Module
• Sub-category: DDR3 SDRAM
• Module Type: 240RDIMM
• Device Core Size: 72b
• Organization: 512Mx72
• Total Density: 4GByte
• Chip Density: 1Gb
• Maximum Clock Rate: 1.066GHz
• Operating Supply Voltage (typ): 1.5V
• Operating Current: 3.06A
• Number Of Elements: 36
• Operating Supply Voltage (max): 1.575V
• Operating Supply Voltage (min): 1.425V
• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Pin Count: 240
• Mounting: Socket
• Lead Free Status / RoHS Status: Compliant

Figure 4: Hysteresis Applied to Temperature Around Trip Points
Table 18: Hysteresis Applied to Alarm Window Bits in the Temperature Register
Temperature Format
PDF: 09005aef830b8963
JSZF36C512x72P.pdf – Rev. B 7/09 EN
Condition
Clears
Sets
Above window bit
Below window bit
Notes:
The temperature trip point registers and temperature readout register use a 2’s comple-
ment format to enable negative numbers. The least significant bit (LSB) is equal to
0.0625°C or 0.25°C, depending on which register is referenced. For example, assuming
an LSB of 0.0625°C:
• A value of 0x018C would equal 24.75°C
• A value of 0x06C0 would equal 108°C
• A value of 0x1E74 would equal –24.75°C
Temperature
1. T
2. T
3. Hyst is the value set in the hysteresis bits of the configuration register.
Gradient
Falling
Rising
T
T
Below Alarm Window Bit
H
L
H
L
is the value set in the alarm temperature lower boundary trip register.
2
is the value set in the alarm temperature upper boundary trip register.
1
Temperature Sensor with Serial Presence-Detect EEPROM
Critical Temperature
4GB (x72, ECC, DR) 240-Pin DDR3 SDRAM RDIMM
T
L
- Hyst
19
T
L
Micron Technology, Inc. reserves the right to change products or specifications without notice.
Temperature
Gradient
T
Falling
Rising
H
Above Alarm Window Bit
-
Hyst
3
©2008 Micron Technology, Inc. All rights reserved.
T
L
-
Critical Temperature
Hyst
T
H
- Hyst
T
H