NAND512W3A2DZA6F NUMONYX, NAND512W3A2DZA6F Datasheet - Page 35

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NAND512W3A2DZA6F

Manufacturer Part Number
NAND512W3A2DZA6F
Description
Manufacturer
NUMONYX
Datasheet

Specifications of NAND512W3A2DZA6F

Cell Type
NAND
Density
512Mb
Access Time (max)
12us
Interface Type
Parallel
Address Bus
26b
Operating Supply Voltage (typ)
3/3.3V
Operating Temp Range
-40C to 85C
Package Type
VFBGA
Sync/async
Asynchronous
Operating Temperature Classification
Industrial
Operating Supply Voltage (min)
2.7V
Operating Supply Voltage (max)
3.6V
Word Size
8b
Number Of Words
64M
Supply Current
30mA
Mounting
Surface Mount
Pin Count
63
Lead Free Status / RoHS Status
Compliant
NAND512xxA2D, NAND01GxxA2C
Table 18.
1. Leakage currents double on stacked devices.
Figure 17. Equivalent testing circuit for AC characteristics measurement
I
Symbol
OL
V
I
I
I
I
V
V
V
DD1
DD2
DD3
DD5
I
V
I
LKO
LO
OH
LI
OL
(RB)
IH
IL
Operating current
DC characteristics, 1.8 V devices
V
DD
Standby current (CMOS)
Output high voltage level
Output low voltage level
Output low current (RB)
Output leakage current
Input leakage current
supply voltage (erase and
Input high voltage
Input low voltage
program lockout)
Parameter
NAND flash
Sequential
Program
Erase
read
C L
GND
V
E=V
V
OUT
Test conditions
IN
t
(1)
I
RLRL
E = V
OH
I
OL
V
WP=0/V
= 0 to V
IL,
= 0 to V
OL
= -100 µA
= 100 µA
I
OUT
minimum
= 0.1 V
DD
- 0.2,
= 0 mA
DD
DD
DD
max
max
V DD
GND
2R ref
2R ref
0.8 x V
V
DD
Min
-0.3
3
-0.1
DD
Ai11085
DC and AC parameters
Typ
1.1
10
8
8
8
4
V
0.2 x V
DD
Max
±10
±10
0.1
15
15
15
50
+ 0.3
DD
35/53
Unit
mA
mA
mA
mA
µA
µA
µA
V
V
V
V
V

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