AT27C512R-12PX Atmel, AT27C512R-12PX Datasheet - Page 7

• Manufacturer Part Number: AT27C512R-12PX
• Manufacturer: Atmel

Specifications of AT27C512R-12PX

• Organization: 64Kx8
• Interface Type: Parallel
• In System Programmable: External
• Access Time (max): 120ns
• Package Type: PDIP
• Reprogramming Technique: OTP
• Operating Supply Voltage (typ): 5V
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Supply Current: 20mA
• Pin Count: 28
• Mounting: Through Hole
• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Lead Free Status / RoHS Status: Compliant

AC Programming Characteristics
T
*AC Conditions of Test:
Notes: 1. V
Atmel’s 27C512R Integrated
Product Identification Code
Sym-
bol
t
t
t
t
t
t
t
t
t
t
t
t
A
Manufacturer
Device Type
AS
OES
OEH
DS
AH
DH
DFP
VCS
PW
DV
VR
PRT
Codes
= 25
Parameter
Address Setup Time
OE/V
OE/V
Data Setup Time
Address Hold Time
Data Hold Time
CE High to
Output Float Delay
V
CE Program Pulse Width
Data Valid from CE
OE/V
OE/V
Time During Programming
Input Rise and Fall Times (10% to 90%).............. 20 ns
Input Pulse Levels....................................0.45V to 2.4V
Input Timing Reference Level....................0.8V to 2.0V
Output Timing Reference Level.................0.8V to 2.0V
2. This parameter is only sampled and is not 100%
3. Program Pulse width tolerance is 100 sec 5%.
CC
5°C, V
OE/V
OE/V
tested. Output Float is defined as the point where
data is no longer driven — see timing diagram.
CC
Setup Time
PP
PP
PP
PP
must be applied simultaneously or before
PP
PP
Setup Time
Hold Time
Recovery Time
Pulse Rise
A0 O7 O6 O5 O4 O3 O2 O1 O0
CC
0
1
.
and removed simultaneously or after
= 6.5
0
0
Test
Condtions*
0
0
(2)
(2)
0.25V, OE/V
0
0
(3)
Pins
1
0
(1)
1
1
PP
Min
95
50
= 13.0
2
2
2
2
0
2
0
2
2
1
1
Limits
1
0
Max
130
105
1
0.25V
0
1
Units
Data
Hex
1E
0D
ns
ns
s
s
s
s
s
s
s
s
s
s
Rapid Programming Algorithm
A 100 s CE pulse width is used to program. The address
is set to the first location. V
OE/V
grammed with one 100 s CE pulse without verification.
Then a verification/reprogramming loop is executed for
each address. In the event a byte fails to pass verification,
up to 10 successive 100 s pulses are applied with a veri-
fication after each pulse. If the byte fails to verify after 10
pulses have been applied, the part is considered failed.
After the byte verifies properly, the next address is se-
lected until all have been checked. OE/V
ered to V
compared with the original data to determine if the device
passes or fails.
PP
is raised to 13.0V. Each address is first pro-
IL
and V
CC
to 5.0V. All bytes are read again and
AT27C512R
CC
is raised to 6.5V and
PP
is then low-
3-141