5962-8752902LA QP SEMICONDUCTOR, 5962-8752902LA Datasheet - Page 9

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5962-8752902LA

Manufacturer Part Number
5962-8752902LA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-8752902LA

Organization
2Kx8
Interface Type
Parallel
In System Programmable
In System/External
Access Time (max)
35ns
Package Type
CDIP
Reprogramming Technique
UV
Operating Supply Voltage (typ)
5V
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Supply Current
120mA
Pin Count
24
Mounting
Through Hole
Operating Temp Range
-55C to 125C
Operating Temperature Classification
Military
Lead Free Status / RoHS Status
Not Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
5962-8752902LA
Manufacturer:
CYP
Quantity:
640
DSCC FORM 2234
APR 97
NOTES:
1.
2.
3.
4.
5.
6.
7.
8.
9.
DEFENSE SUPPLY CENTER COLUMBUS
See figure 3A for all switching characteristics except t
See figure 3B for t
All device test loads should be located within 2 inches of device outputs.
Ensure that adequate decoupling capacitance is employed across the device VCC and ground terminals. Multiple
capacitors are recommended, including a 0.1uF or larger capacitor and a 0.01 µF or smaller capacitor, placed as close to
the device terminals as possible. Inadequate decoupling may result in large variations of power supply voltage, creating
erroneous function or transient performance failures.
Do not leave any inputs disconnected (floating) during any tests.
Do not attempt to perform threshold tests under ac conditions. Large amplitude fast ground current transients normally
occur as the device outputs discharge the load capacitances. These transients flowing through the parasitic inductance
between the device ground pin and the test system ground can create significant reductions in observable input noise
immunity.
Output levels are measured at 1.5 V reference levels.
Transition is measured at steady-state HIGH level -500 mV or steady-state LOW level +500 mV on output from the 1.5 V
level on inputs with load shown on figure 3B.
Tests are performed with rise and fall times of 5ns or less.
COLUMBUS, OHIO 43218-3990
MICROCIRCUIT DRAWING
STANDARD
HZC
and t
HZE
.
FIGURE 4. Switching waveforms - continued.
HZC
and t
HZE
.
SIZE
A
REVISION LEVEL
E
SHEET
5962-87529
9

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